High and low temperature in-situ XRD testing device

The high and low temperature in-situ XRD testing device is an experimental equipment mainly used to study the structural evolution of materials at different temperatures (including high and low temperatures).

1High and low temperature in-situ XRD testing deviceProduct Features:

1) The device is suitable for electrochemical in-situ XRD testing of positive and negative electrode materials in systems such as lithium-ion batteries, lithium sulfur batteries, sodium ion batteries, and aqueous zinc ion batteries;

2) The device has good sealing performance and can perform electrochemical in-situ XRD testing under temperature control conditions as well as XRD testing under different atmospheres;

3) Easy to operate, adopting a quick release design, convenient mold installation, good testing consistency, and avoiding experimental deviations caused by different operating methods;

4) The device design is flexible, with good scalability, and can be improved in temperature range and heating/cooling rate according to user requirements;

5) The window can be specially customized according to user needs (metal, non-metal X-ray window)

6) Optional multi-channel gas mixing system, expanded gas leak detection, gas monitoring and other replica devices to achieve multi technology integration.

IIHigh and low temperature in-situ XRD testing deviceTechnical Specifications:

1) The device consists of a high and low temperature controller, upper computer software, low temperature unit (liquid nitrogen system), high and low temperature sample stage, chamber, vacuum system, etc;

2) The high-temperature heating unit adopts imported resistance wire for direct heating, with a temperature control range from room temperature to 200.0 ° C (can operate for a long time), and a temperature control accuracy of ± 0.5 ° C;

3) The refrigeration unit adopts a low-temperature liquid nitrogen system, with a temperature control range of room temperature to -180.0 ℃ and a temperature control accuracy of ± 0.5 ℃;

4) The temperature sensor is placed on the lower side of the sample and can provide accurate feedback on the temperature in the sample area

5) The external dimensions of the device are 100 * 80 * 55 mm;

6) The device adopts an arc-shaped window structure, and the window material is a polymer amorphous thin film with a thickness of 10-20 μ m. Under the condition of 8keV, the X-ray transmittance is greater than 95%, and under the condition of a row angle of 10-90 °, the traditional X-ray intensity is not lost due to the angle;

7) Conventional testing angle range 2theta=10 ° -140 ° (can reach 5 °);

8) In low-temperature testing, a vacuum or inert atmosphere is maintained inside the chamber, and a mass flow meter is used to control the gas flow rate. The flow meter has a range of 10 sccm and an accuracy of ± 0.2 sccm;

9) The device is equipped with a conversion adjustment table and a sample table transition bracket, which can be matched with various models of diffractometers.

3、 Temperature range:

The temperature range of high and low temperature in-situ XRD cells is usually wide, covering environments from low temperatures (such as -53 ℃) to room temperature or even higher temperatures. This makes it suitable for studying the structural changes of materials over a wide temperature range.

In summary, the high and low temperature in-situ XRD cell has various design features and technical advantages, and has broad application prospects in multiple research fields.