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Anhui Chuangpu Instrument Technology Co., Ltd

  • E-mail

    zhengyz@specreation.com

  • Phone

    15656931004

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    Building 11, Guoke Juntong Industrial Park, No. 103 Huatuo Lane, High tech Zone, Shushan District, Hefei City, Anhui Province, China. Anhui Chuangpu Instrument

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In situ X-ray absorption spectroscopy

NegotiableUpdate on 02/05
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Overview
In situ X-ray absorption spectroscopy reveals the structural evolution of materials in real environments by monitoring the near edge (XANES) and extended edge (EXAFS) signals of the absorption edge in real-time during the reaction process, providing a direct basis for understanding the structure-activity relationship and optimizing material design.
Product Details
In situ X-ray absorption spectroscopy utilizes conventional X-ray sources to achieve spectral measurement of X-ray absorption fine structures (XAFS), which has a good complementary and expanding effect on major technological infrastructure such as synchrotron radiation, as well as scientific instruments such as electron microscopes and X-ray diffractometers. This product has been selected by many universities such as Peking University, Beihang University, Tianjin University, North China Electric Power University, Qinghai University, Anhui University, etc., effectively assisting in related scientific research and application development!
Compact desktop system, easy to use:
·Support near edge quick scan function;
·Support extended functions such as in-situ testing;
·Ergonomic high design, more convenient operation;
·Built in experimental parameter presets for fast measurement;
·One click automatic switching between different samples and measurement modes;
·Remote data transmission, real-time display of experimental progress and results, supporting unmanned testing;
·Professional application technology support and data analysis support;
·The instrument has radiation exemption qualifications and multiple safety protection interlocks to ensure personal and usage safety.
  XAFS specialized bent crystal:
·Complete configuration of different crystal faces to achieve coverage of various elements;
·Pre aligned installation, plug and play;
·Special bent crystals can be customized according to the required elements to achieve optimal performance.
  X-ray Absorption Fine Structure (XAFS) Spectrometer X-ray Absorption Spectroscopy Testing Energy Scanning Mechanism:
·Linkage scanning mechanism;
·Realize precise linkage between light source, bent crystal, sample, and detector;
·High precision and resolution, good stability.