Hitachi SU3800 tungsten filament scanning electron microscope

Hitachi's new generation high-resolution tungsten filament scanning electron microscope SU3800 adopts a new HexBias bias technology, which greatly improves its low voltage performance. At the same time, the upgraded high-sensitivity backscatter detector and variable pressure detector further enhance the observation ability of SU3800. SU3800 has also added IFT filament monitoring technology, new mirror navigation, integrated energy spectrum, and report export functions, making its operation simpler.

Main features:

• HexBias tungsten filament electron gun;
• Excellent high and low voltage performance;
• High sensitivity five segment backscattered electron detector;
• Variable pressure secondary electronic detector (available for high and low vacuum);
• New operating interface and light mirror navigation function;
• Fully automatic filament setting and axis closing;
• Report export and image processing;
• Integrated EDS;
• Simple and convenient maintenance (filament replacement video);