Hitachi FlexSEM 1000 tungsten filament scanning electron microscope

NegotiableUpdate on 10/07

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

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Overview

FlexSEM1000 is a compact and high-performance tungsten filament electron microscope recently launched by Hitachi High Tech. It features a large beam current and low aberration objective lens and condenser design, equipped with a high-resolution secondary electron probe and a high-sensitivity five segment backscatter probe. It has excellent low vacuum imaging energy and adopts the latest SEMMAP high-precision navigation system and the latest and most comprehensive automation functions, making performance superior and usage easier

Product Details

FlexSEM1000 is a compact and high-performance tungsten filament electron microscope recently launched by Hitachi High Tech. It features a large beam current and low aberration objective lens and condenser design, as well as a high-resolution secondary electron probe and a high-sensitivity five segment backscatter probe. It has excellent low vacuum imaging energy and adopts the latest SEM MAP high-precision navigation system and the latest and most comprehensive automation functions, making its performance superior and usage easier.

Features:

1. Energy saving and environmentally friendly design

2. Efficient automatic function

3. Simple and user-friendly interface

4. High resolution low vacuum observation

Technical parameters:

Resolution	4.0nm (acceleration voltage 20kV, high vacuum mode, secondary electron image)
	15.0nm (acceleration voltage 1kV, high vacuum mode, secondary electrons)
	5.0nm (acceleration voltage 20kV, low vacuum mode, backscattered electron image)

magnification	Film magnification: 6-3000000x
	Display magnification: 16-800000x

Acceleration voltage	0.3-20kV
Low vacuum variable pressure range	6-100Pa
Madatai	Standard three-axis automatic motor
itinerary	X： 0-40mm
	Y： 0-50mm
	R： 360 °
	Z： 5-15mm
	T： -15- 90°
Electronic optical system	Electron gun: pre aligned tungsten filament
Electronic optical system	Signal detection system: secondary electronic detector; High sensitivity backscatter detector

vacuum system	Fully automatic valve controlled vacuum pumping system/turbo molecular pump: 1 set of 61L/S
	Mechanical pump: 1 unit at 100L/min
	Safety device: vacuum protection function with power outage and leakage protection
Operation assistance function	Electron beam rotation; Dynamic focus; Image quality optimization function
	Data input; Measurement between 2 points, angle measurement, and text; Preset magnification;
	Sample table position navigation function (SEM MAP); Electron beam marking