High resolution scanning electron microscope

Quattro SEM is an extremely flexible and versatile tool with environmental vacuum capabilitiesHigh resolution scanning electron microscopeThe comprehensive performance of imaging and analysis can be combined with Environmental Mode (ESEM) to enable sample research to be conducted in a natural state.

Quattro SEMHigh resolution scanning electron microscopeparameter

Source of emission: High stability Schottky field emission electron gun

Resolution:

Magnification: 6~2500000 ×
Acceleration voltage range: 200V~30kV
Probe current range: 1pA -200nA, continuously adjustable
X-Ray working distance: 10mm, EDS detection angle of 35 °
Sample Room: A large storage space with a width of 340mm from left to right. The sample room can accommodate 12 expandable interfaces, including 3 spectrometer interfaces (2 of which are located at 180 ° diagonal positions)

Sample stand and samples:

Detector system:

Synchronize detection of up to four types of signals, including

Sample chamber high vacuum secondary electron detector ETD
Low vacuum secondary electron detector LVD
Gas SED (GSED, used for environmental scanning mode)
IR-CCD infrared camera in the sample room (observing the height of the sample stage)
Nav Cam color optical camera for sample navigation ™

Control system:
Operating system: 64 for GUI (Windows 10), keyboard, optical mouse
Image display: 24 inch LCD monitor, WUXGA 1920 × 1200
Customized image user interface that can activate up to 4 views simultaneously
Navigation montage
The software supports undo and redo functions