Environmental vacuum scanning electron microscope

Quattro SEMEnvironmental vacuum scanning electron microscopeTo achieve flexible and multifunctional high-resolution scanning electron microscopy with environmental vacuum function, the comprehensive imaging and analysis performance can be combined with environmental mode (ESEM), allowing sample research to be conducted in a natural state.

Quattro's field emission electron gun (FEG) ensures excellent resolution, and different detector options can be used to adjust different contrast information, including directional backscattering, STEM, and cathodoluminescence information. Images from multiple detectors and detector discrimination can be synchronously collected and displayed, enabling a single scan to obtain sample information, thereby reducing the beam exposure of electron beam sensitive samples and achieving true dynamic testing. Quattro's three vacuum modes make the system flexible and capable of accommodating a wide range of sample types, providing reliable analysis results regardless of sample conductivity, insulation, humidity, or high temperature conditions. Quattro *'s hardware has user guide support, which not only guides the operator, but also allows for direct exchange, easily reducing the time required to obtain results.

Metals and alloys, fracture surfaces, solder joints, polished surfaces, magnetic and superconducting materials
Ceramics, composite materials, plastics
Thin film/coating
Geological sample cross-section, minerals
Soft materials: polymers, drugs, filter membranes, gel, biological tissues, plant materials
Particles, porous materials, fibers
Hydration/dehydration/wetting/contact angle analysis
Crystallization/phase transition
Oxidation/Catalysis
Material generation
Stretching (accompanied by heating or cooling)

Source of emission: High stability Schottky field emission electron gun

Resolution:

Magnification: 6~2500000 ×
Acceleration voltage range: 200V~30kV
Probe current range: 1pA -200nA, continuously adjustable
X-Ray working distance: 10mm, EDS detection angle of 35 °
Sample Room: A large storage space with a width of 340mm from left to right. The sample room can accommodate 12 expandable interfaces, including 3 spectrometer interfaces (2 of which are located at 180 ° diagonal positions)

Sample stand and samples:

Detector system:

Synchronize detection of up to four types of signals, including

Sample chamber high vacuum secondary electron detector ETD
Low vacuum secondary electron detector LVD
Gas SED (GSED, used for environmental scanning mode)
IR-CCD infrared camera in the sample room (observing the height of the sample stage)
Nav Cam color optical camera for sample navigation ™

Control system:
Operating system: 64 for GUI (Windows 10), keyboard, optical mouse
Image display: 24 inch LCD monitor, WUXGA 1920 × 1200
Customized image user interface that can activate up to 4 views simultaneously
Navigation montage
The software supports undo and redo functions

Quattro SEMEnvironmental vacuum scanning electron microscopeCharacteristics and Applications:

A high-resolution field emission scanning electron microscope with environmental vacuum mode (ESEM) is used to study materials in their natural state;

Shorten sample preparation time: Low vacuum and environmental vacuum technologies can directly image and analyze non-conductive and/or water containing samples, with no charge accumulation on the sample surface;
Analyze conductive and non-conductive samples in various operating modes, and simultaneously obtain secondary electron images and backscattered electron images;
Excellent analytical performance, the sample chamber can simultaneously install three EDS detectors, with two EDS ports separated by 180 °, WDS, and shared EDS/EBSD;
Analysis performance for non-conductive samples: EDS and EBSD analysis in low vacuum mode is achieved through the use of a "differential pressure vacuum system";
Flexible and accurate center sample stage, with a tilt angle range of 105 °, capable of observing samples from multiple angles;
The software is intuitive, easy to use, and equipped with a user guide and undo function, reducing the number of operation steps and making analysis faster;
Innovative options include a scalable RGB cathodoluminescence (CL) detector, a 1100 ℃ high vacuum hot stage, and AutoScript.