Hebei FT-340 series dual electric four probe resistivity/square resistance tester

NegotiableUpdate on 01/09

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Hebei FT-340 series dual electric four probe resistivity/square resistance tester

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Product Introduction

FT-340 series dual electric four probe resistivity/square resistance tester

This instrument adopts the four probe dual electric measurement method and is suitable for production enterprises, universities, and research departments. It is an important tool for inspecting and analyzing the quality of conductor and semiconductor materials. This instrument is equipped with various measuring devices to test different materials. LCD display, no need for manual calculation, with temperature compensation function, automatic selection of resistivity unit

Detailed informationFT-340seriesDual electric measurement with four probes

Resistivity/square resistance tester	Specification Model	FT-341	FT-342	FT-343	FT-345	FT-346
1.FT-347	10^-5Block resistance range10⁵～2×	10^-4Ω/□10³～2×	10^-3Ω/□10⁵～2×	10^-3Ω/□10³～2×	10^-2Ω/□10⁵～2×	10^-2Ω/□10³～2×
2.Ω/□	10^-6Range of resistivity10⁶～2×	10^-5Omega cm10⁴～2×	10^-4-cm10⁶～2×	10^-4Omega cm10⁴～2×	10^-3-cm10⁶～2×	10^-3Omega cm10⁶～2×
3.Omega cm	Test current range0.1μA,μA,0μA	，100µA，1mA，10mA，100 mA1μA	10μA, 100μA, 1mA, 10mA, 100mA0.1μA,μA	10μA, 100μA, 1mA, 10mA, 100mA1μA	10μA, 100μA, 1mA, 10mA, 100mA0.1μA	1μA, 10μA, 100μA, 1mA, 10mA, 100mA1μA
4.10μA, 100μA, 1mA, 10mA, 100mA	Current accuracy±0.1%	reading±0.2%	reading±0.2%	reading±0.3%	reading±0.3%	reading±0.3%
5.reading	Resistance accuracy	≤0.3%	≤0.3%	≤0.3%	≤0.5%	≤0.5%
6.≤0.5%	Display reading Large screen LCD display: resistance, resistivity, square resistance, temperature, unit conversion, temperature coefficient, current, voltage, probe shape, probe spacing, thickness
7.Conductivity	test method
8.Dual electric measurement	working power supplyinput: AC 220V±10% ,50Hz meritConsumption:
9.<30W	Complete machine uncertainty error≤3%
10.(Standard Sample Results)	Selection function
11.Choose 1. PC software; Choose 2. Square probe; Choose 3. Linear probe; Purchase 4. Testing Platform	Test probe