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HELMUT FISCHER Agent X-ray XDL230
NegotiableUpdate on 05/07
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Overview
HELMUT FISCHER X-ray XDL230 and FISCHERSCOPE X-RAY XDL 230 are high-performance, energy dispersive X-ray fluorescence (XRF) coating thickness gauges launched by Helmut Fischer, a German company. They are mainly used for industrial quality control and incoming material inspection, and are the mainstream models with high cost-effectiveness in the XDL series.
Product Details
HELMUT FISCHER Agent X-ray XDL230
Core technical parameters of Fisher X-ray thickness gauge XDL230
Measurement principle: X-ray fluorescence spectroscopy (XRF), non-destructive testing.
The range of elemental analysis is from chlorine (Cl, atomic number 17) to uranium (U, atomic number 92).
Measurement ability:
Up to 24 elements and 23 layers of coating can be analyzed simultaneously.
Thickness range: nanometer to millimeter.
Accuracy: Reproducibility coefficient of variation<0.5%; When the thickness is ≥ 0.5 μ m, the top layer accuracy is ≤ 5%.
HELMUT FISCHER Agent X-ray XDL230X-ray system:
Radiation tube: tungsten target with beryllium window.
High voltage: adjustable in three levels: 30kV/40kV/50kV.
Collimator: comes standard with a diameter of 0.3mm, and can be selected from a diameter of 0.1mm/0.2mm or rectangular.
Minimum spot size: approximately 0.2mm (with a collimator diameter of 0.1mm).
Detector: Proportional Counter (PC).
Sample stand:
Manual XY axis: movement range of 95 × 150 mm.
Electric Z-axis: stroke of 140 mm.
DCM distance compensation: supports 0-80mm deep cavity measurement.
Positioning system: 40-160x high-resolution CCD camera+laser positioning.
Analysis method: Fischer basic parameter method (FP), supporting measurement without standard samples.
Size and weight: 570 × 760 × 650 mm; 107 kg.
