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Duzhi Instrument (Shanghai) Co., Ltd
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Duzhi Instrument (Shanghai) Co., Ltd

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    15921165535

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    No. 418 Huajing Road, Shanzhong Science and Technology Park, Waigaoqiao Free Trade Zone, Pudong New Area, Shanghai

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German Fischer XDLM 237 fluorescence ray film thickness gauge

NegotiableUpdate on 01/12
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Overview
The XDLM measurement system is often used to measure the thickness of Au/Ni, Au/PdNi/Ni, Ag/Ni, or Sn/Ni coatings on various substrates of connectors and contacts
Product Details

Product description


Comparison between FISCHERSCOPE X-RAY XDL XDLM series and XULXUUM:

The FISCHERSCOPE X-RAY XDL XDLM series is closely related to the XULXUUM series: both use the same receiver, collimator, and filter combination. The XDL instrument equipped with standard X-ray tubes and fixed collimators is very suitable for measuring large workpieces. The X-ray source of XDLM model adopts a micro focusing tube, which can measure small components and has a good excitation effect on low radiation components. In addition, XDLM is equipped with an automatically switchable collimator and multiple filters that can flexibly create favorable excitation conditions for different measurement applications.Both models of instruments are equipped with proportional receiver detectors. Even for very small measurement points, due to the large receiving area of the receiver, a sufficiently high counting rate can still be obtained to ensure good repeatability accuracy.


Compared to XUL and XUM instruments, the XDL and XDLM series instruments measure the direction from Up to down. They are designed as user-friendly desktop computers with a modular structure, which means they can be equipped with simple support boards, various XY workbenches, and Z-axis to meet different needs. The XDL series instruments equipped with programmable XY workbenches can be used for automated series testing. It can easily scan the surface, so that its uniformity can be checked. For simple and fast sample positioning, when the measurement door is opened, the XY worktable automatically moves to the loading position, while the laser point indicates the position of the measurement point. For large and flat samples, such as circuit boards, the shell has an opening (C-shaped groove) on the side. Due to the large space in the measurement room and convenient placement of samples, the instrument can not only measure flat objects, but also large samples with complex shapes (sample height can reach 140mm). The Z-axis is an electrically adjustable instrument, and the measurement distance can be freely selected within the range of 0-80 mm, allowing for the measurement of objects inside or on uneven surfaces of the cavity (DCM method).


Product Model

FISCHERSCOPEX-RAY XDL M231 Fluorescent Coating Thickness Gauge
FISCHERSCOPE X-RAY XDLM 232 X-ray Fluorescence Coating Thickness Gauge
FISCHERSCOPE X-RAY XDLM237 X-ray Fluorescence Coating Thickness Measurement and Material Analyzer


Application example:

The XDLM measurement system is often used to measure the thickness of Au/Ni, Au/PdNi/Ni, Ag/Ni, or Sn/Ni coatings on various substrates of connectors and contacts. Usually, functional areas are small structures such as advanced or protruding, and measuring these areas requires the use of small collimators or collimators suitable for the shape of the sample. For example, when measuring elliptical samples, a slotted collimator should be used to obtain the maximum signal intensity.


 电镀液成分分析:Cu, Ni, Au (g/l

Composition analysis of electroplating solution: Cu, Ni, Au (g/l)

PCB测量: Au/Ni/Cu/PCB

PCB测量: Au/Ni/Cu/PCB



Feature:

X-ray tubes with glass windows and tungsten targets or micro focused X-ray tubes with beryllium windows and tungsten targets. *High working conditions: 50KV, 50W
The X-ray detector adopts a proportional receiver
Collimator: fixed or 4 automatic switches, 0.05 x0.05 mm to 00.3 mm
Basic filter: fixed or 3 automatic switches
The measurement distance can be adjusted within the range of 0-80 mm
Fixed sample support table, manual XY worktable
The camera is used to view the measurement position of the basic ray axial direction. The scale line has been calibrated to display the actual measurement point size.
The design has obtained permission, comprehensive protection, and complies with Chapter 4, Section 3 of the German X-ray Regulations

Typical application areas:

Large scale measurement of electroplated parts
Corrosion resistant and decorative coatings, such as chrome plating on nickel or copper
Analysis of Building Solutions in the Electroplating Industry
Strategies for Thin Gold, Platinum, and Nickel Coatings in the PCB Industry
Measure the coating of connectors and contacts
Functional coating measurement in the electronics and semiconductor industries
The gold, jewelry, and watch industries