-
Phone
15921165535
-
Address
No. 418 Huajing Road, Shanzhong Science and Technology Park, Waigaoqiao Free Trade Zone, Pudong New Area, Shanghai
Duzhi Instrument (Shanghai) Co., Ltd
15921165535
No. 418 Huajing Road, Shanzhong Science and Technology Park, Waigaoqiao Free Trade Zone, Pudong New Area, Shanghai
The FISCHERSCOPE X-RAY XDL XDLM series is closely related to the XULXUUM series: both use the same receiver, collimator, and filter combination. The XDL instrument equipped with standard X-ray tubes and fixed collimators is very suitable for measuring large workpieces. The X-ray source of XDLM model adopts a micro focusing tube, which can measure small components and has a good excitation effect on low radiation components. In addition, XDLM is equipped with an automatically switchable collimator and multiple filters that can flexibly create favorable excitation conditions for different measurement applications.Both models of instruments are equipped with proportional receiver detectors. Even for very small measurement points, due to the large receiving area of the receiver, a sufficiently high counting rate can still be obtained to ensure good repeatability accuracy.
Compared to XUL and XUM instruments, the XDL and XDLM series instruments measure the direction from Up to down. They are designed as user-friendly desktop computers with a modular structure, which means they can be equipped with simple support boards, various XY workbenches, and Z-axis to meet different needs. The XDL series instruments equipped with programmable XY workbenches can be used for automated series testing. It can easily scan the surface, so that its uniformity can be checked. For simple and fast sample positioning, when the measurement door is opened, the XY worktable automatically moves to the loading position, while the laser point indicates the position of the measurement point. For large and flat samples, such as circuit boards, the shell has an opening (C-shaped groove) on the side. Due to the large space in the measurement room and convenient placement of samples, the instrument can not only measure flat objects, but also large samples with complex shapes (sample height can reach 140mm). The Z-axis is an electrically adjustable instrument, and the measurement distance can be freely selected within the range of 0-80 mm, allowing for the measurement of objects inside or on uneven surfaces of the cavity (DCM method).
Composition analysis of electroplating solution: Cu, Ni, Au (g/l)
PCB测量: Au/Ni/Cu/PCB