Form Talysurf PGI series Taylor Hopson profilometer

NegotiableUpdate on 01/11

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Overview

Form Talysurf PGI series Taylor Hopson profilometer

Product Details

product description

Adhering to the excellent tradition of Taylor Hopson in producing high-end measuring instruments,Form Talysurf PGISeries instruments can provide convenient high-precision measurement tools in any type of manufacturing industry. We will provide you with a complete set of calibration balls as a reference for measuring whether your product meets industry standards. This instrument is a roughness profiler with wide applicability, which can be matched with a series of probes and accessories of different specifications to meet different measurement needs. Thanks to PGI's advanced precision measurement technology, this instrument will provide you with high-precision measurement results.

The multi axis roughness profilometer only requires a small amount of operation from the operator, or even no operation at all. This convenient roughness profiler is specially designed with the probe head placed at the top. However, in practical operation, the demand for readjusting or moving the detection components far outweighs the need to replace the measured axis. For example, when we measure some complex parts,Form Talysurf PGIThe multi axis roughness profiler can fully meet these requirements.

features:

Outstanding series of analytical instruments
Very high accuracy in shape measurement
Flexible instrument structure allows for flexible measurement of components in any plane
Obtaining the scale line of * * without * *
Record data with a spacing of 0.125 μ m between data points
Fully automatic measurement and control
Vertical range 12.5mm, corresponding resolution 0.8nm
High precision ensures measurement accuracy

Excellent range and resolution
The PGI instrument has a vertical measurement range of 12.5 millimeters (standard 60 millimeter stylus) and a resolution of 0.8 nanometers, providing a wide range for measuring shapes and contours, as well as the resolution required for surface smoothness.

Special * * Calibration
Calibration is simple, fast, and accurate using our * * and fully automated single channel measurement programs. The numbers and visual results make users believe that calibration and any subsequent measurements are correct.

200 mm horizontal drive length, straightness 0.125 μ m
The reference rod for precision grinding provides a reference for all contour measurements; High precision straightness eliminates instrument errors and preserves the true shape of the workpiece.

0.125 μ m high-density horizontal data interval
Without high-density data collection, it is impossible to achieve precise reproduction of part contours. *The big data points are 1600000 with a spacing of 0.125 μ m, ensuring very fine details for both small and large components.

Low system noise 2nm
The low noise of the entire system makes the roughness measurement capability unparalleled in this type of instrument.

PGI400/800/1200 specification:

Horizontal performance	400	800	1200
Drive length	120mm/0.1mm	200mm/ 0.1mm
Measurement speed	0.1mm/s,0.25mm/s,0.5mm/s&1mm/s
Drive speed	0.1-10mm/s(0.004-0.39in/s)
Small data sampling interval on the x-axis	0.125μm over 120mm	0.125μm over 200mm
*Big data points	960,000	1,600,000
traightnesserror[Pt](X= length)2	0.35μm/120mm	0.35μm/200mm	125nm/200mm
Benchmark calibration	optional	optional	standard
Vertical performance	400	800	1200
Nominal range(Z)	4mm [60mm stylus arm]	8mm 60mm stylus arm]	12.5mm [60mm stylus arm]
resolution(Z)3	12.8nm@4mm range	3.2nm@8mm range	0.8nm@12.5mm range
Ratio of range to resolution	312,500 : 1	2,500,000 : 1	15,625,000 : 1
Measuring needle arm length, needle tip size, force measurement	60mmarm,2μmradiusconispherediamondstylus, 1mNforce120mmarm,0.5mmradiusball, 20mNforce
Z-axis nonlinearity (Z=sensor displacement))	(0.07+0.03Z[mm])μm(3+30Z[inches]）μ in - after calibration
Z-axis indication repeatability (plane diamond probe)	0.1μm(4μin)		0.15μm (6.1μin)
Z-axis indication repeatability (surface diamond probe)	0.8μm (3.2μin)		0.16μm (6.3μin)
Z-axis indication repeatability (curved spherical measuring needle)	0.12μm (4.5μin)
performance	400	800	1200
Calibrate PT	0.15μm(6μin)		0.2μm (8μin)
Spherical calibrator (accuracy)	80m m (3.15in) nominal radius glass standard [5m m (197m in)]
System noise - RQ	Usually 5nm (0.02 μ in)	Usually it is3nm (0.12μin)	Usually it isnm (0.08μin)
Uncertainty in radius measurement	0.1 - 80mm (0.004 - 3.15in) = 1 to 0.005% of nominal80 - 1000mm (3.15 - 39.4in) = 0.005 to 0.1% of nominal1000 - 2000mm(39.4- 78.7in)= 0.1%of nomin
Uncertainty in inclination measurement	0.5 arc minuteuncertainty(+ / - 35º maximum
sizeL x D x H (instrument and base)	900 x 880 x 1750mm(35.4x 34.6 x 68.9in)
sizeL x D x H (computer stand)	900 x 880 x 760mm(35.4x 34.6x 30in）
Electric pillar	450mm(17.7in)verticaltraverse

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