Filmetrics F20 Single Point Optical Film Thickness Measuring Instrument

Filmetrics F20 White Light Interference Thickness GaugeIntroduction:

Whether you want to know film thickness, optical constants, or material reflectivity and transmittance, the Filmetrics F20 single point optical film thickness gauge can meet your needs. It only takes a few minutes to complete the installation, and the device can obtain measurement results within seconds by connecting to a computer via USB. Based on the characteristics of modular design, the Filmetrics F20 single point optical film thickness measuring instrument is suitable for various applications.

Filmetrics F20 White Light Interference Thickness GaugeFeatures:

• Non contact measurement: to avoid damaging the film, suitable for fragile or sensitive materials;

• High precision and wide range: vertical resolution up to nanometer level, measurable thickness range from 1nm to 3mm;

• Multi scenario applicability: Basically smooth, semi transparent, or low absorption coefficient films can be measured.

• Fast measurement speed: After configuration is completed, the measurement can be completed within seconds.

Measurement principle:

When incident light passes through interfaces of different substances, some of the light will be reflected. Due to the fluctuation of light, the reflected light from multiple interfaces interferes with each other, resulting in oscillations in the multi wavelength spectra of the reflected light. From the oscillation frequency of the spectrum, the distance between different interfaces can be determined to obtain the thickness of the material (more oscillations represent greater thickness), as well as other material properties such as refractive index and roughness.

Film layer example:

• Thin film characteristics: thickness, reflectivity, transmittance, optical constant, uniformity, etching amount, etc

• Film types: transparent and semi transparent films, commonly such as oxides, polymers, and even air

• Thin film state: Solid, liquid, and gaseous thin films can all be measured

• Thin film structure: single-layer film, multi-layer film; Flat and curved surfaces

Common industrial applications:

Product Parameters:

Measurement diagram: