FT-361Ultra low resistanceDual electric four probeTester
1、 Overview: This product is designed to solve the problem of measuring the square resistance and electrical resistivity of ultra-low resistance materials using the four probe method. It can be tested for small values1uΩSquare resistance value is currently the smallest value that can be measured in the same industry, using high precisionADChip control, constant current output, reasonable structure, lightweight quality, safe transportation, and convenient use; Suitable for production enterprises, universities, and research departments, it is an important tool for inspecting and analyzing the quality of conductor and semiconductor materials. This instrument is equipped with various measuring devices to test different materials. LCD display, no need for manual calculation, with temperature compensation function, automatic selection of resistivity unit, instrument automatic measurement and automatic range conversion based on test results, no need for manual multiple and repeated settings. Optional: Equipped with software that can be controlled by a computer, saving and printing data, and automatically generating reports; This instrument adopts4.3Large LCD screen display, simultaneously displaying LCD display: resistance, resistivity, square resistance, temperature, unit conversion, temperature coefficient, current, voltage, probe shape, probe spacing, thickness.
Conductivity, different testing fixtures can meet the testing requirements of different materials. Testing fixtures can be selected according to product and testing project requirementsThe dual electric measurement digital four probe tester uses linear or square four probe dual position measurement. The instrument design complies with the physical testing method standards for single crystal silicon and references the United StatesA.S.T.M
Standard. By using the transformation of current probes and voltage probes, two electrical measurements are taken, and the data is analyzed using dual electrical measurements. This automatically eliminates the influence of sample geometry, boundary effects, probe misalignment, and mechanical drift on the measurement results. Compared with single electrical measurement linear or square four probe probes, it greatly improves the accuracy, especially suitable for testing micro areas with oblique four probe probes..
Purchase: This machine can also be used in conjunction with various environmental temperature test chambers, and different measuring fixtures can be used to meet the needs of measuring square resistance and resistivity at different environmental temperatures2、 Widely used for: covering film;Conductive polymer film, high and low temperature electric heating film;Thermal insulation, radiation protection, conductive window film, conductive(shield)Cloth, decorative film, decorative paper;Metallized labels, alloy foil films;Melting, sintering, sputtering, coating, coating layer, resistive and capacitive touch screen film;
Resistance testing of electrode coatings, other semiconductor materials, and thin film materialsSilicon block, chip resistivity and diffusion layer, epitaxial layerITO Conductive foil film, conductive rubber and other materials block resistance Thin layer resistance and resistivity of semiconductor materials/wafers, solar cells, electronic components, conductive thin films (ITO conductive film glass, etc.), metal films, conductive paint films, evaporated aluminum films, PCB copper foil films, EMI coatings, and other substancesConductive paint, conductive paste, conductive plastic, conductive rubber, conductive film, metal film, anti-static material,EMI
Protective materials, conductive fibers, conductive ceramics, etc
3、 Parameter data-61. Block resistance range: 102～2×10
Ω/□-72. Range of resistivity: 102～3×10
Ω-cm3. Test current range:0.1μA，1μA，10μA，
100µA.4. Current accuracy:±0.1%
reading
5. Resistance accuracy: ≤ 0.3%.
6. Display readings: LCD display: resistance, resistivity, square resistance, temperature, unit conversion, temperature coefficient, current, voltage, probe shape, probe spacing, thickness, conductivity7. Testing method:
Dual electric measurement8. Working power supply:input:AC 220V±10% ,50Hz
power waste:<30W9. Uncertainty error of the whole machine
:≤ 4% (standard sample result)10. Selection function:choose 2.1.pc 3.Software; 4.Square probe;
Linear probe; Testing Platform11. Test probe:Probe spacing selection:1mm；2mm；3mmThree specifications;Probe material selection: tungsten carbide needle
;White steel needle; Gold plated phosphor copper hemispherical needle.
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