FT-335 ordinary four probe resistivity/square resistance tester

FT-335Conventional four probe resistivity/Square resistance tester

According to the international standard for measuring the resistivity of silicon wafers（ASTM F84）The instrument is designed and manufactured in accordance with the standard designGB/T 1551-2009Method for Measuring the Electrical Resistance of Silicon Single CrystalsGB/T 1551-1995Measurement of resistivity of silicon and germanium single crystals using direct current two probe methodGB/T 1552-1995Determination of resistivity of silicon and germanium single crystals using direct current four probe method, with reference to the United StatesA.S.T.MStandard, local configuration232Computer interface andUSBTwo interfaces are used in combination with this machineVanderburg measurement principleIt can improve the influence and error of external factors such as geometric dimensions, boundary effects, probe misalignment, and mechanical drift on the measurement results of samples, and is more complete and advanced than other common four probe testing methods on the market,Especially for products with smaller block resistance values, measurement is more accurate.

This instrument adopts the four probe single electric measurement method, which is suitable for production enterprises, universities, and scientific research departments. It is an important tool for inspecting and analyzing the quality of conductor materials and semiconductor materials. This instrument is equipped with various measuring devices to test different materials. LCD display, no need for manual calculation, with temperature compensation function, automatic selection of resistivity unit, instrument automatic measurement and automatic range conversion based on test results, no need for manual multiple and repeated settings. Adopting high precisionADChip control, constant current output, reasonable structure, lightweight quality, safe transportation, and convenient use; Optional: Equipped with software that can be controlled by a computer, saving and printing data, and automatically generating reports; This instrument adopts4.3Large LCD screen display, simultaneously displaying LCD display: resistance, resistivity, square resistance, temperature, unit conversion, temperature coefficient, current, voltage, probe shape, probe spacing, thickness.

Conductivity, different testing fixtures can meet the testing requirements of different materials. Testing fixtures can be selected according to product and testing project requirementsWidely used for: covering film;Conductive polymer film, high and low temperature electric heating film;Thermal insulation, radiation protection, conductive window film, conductive(shield)Cloth, decorative film, decorative paper;Metallized labels, alloy foil films;Melting, sintering, sputtering, coating, coating layer, resistive and capacitive touch screen film;

Resistance testing of electrode coatings, other semiconductor materials, and thin film materialsSilicon block, chip resistivity and diffusion layer, epitaxial layerITO Conductive foil film, conductive rubber and other materials block resistance Thin layer resistance and resistivity of semiconductor materials/wafers, solar cells, electronic components, conductive thin films (ITO conductive film glass, etc.), metal films, conductive paint films, evaporated aluminum films, PCB copper foil films, EMI coatings, and other substancesConductive paint, conductive paste, conductive plastic, conductive rubber, conductive film, metal film, anti-static material,EMI

Protective materials, conductive fibers, conductive ceramics, etc

Parameter data^-21. Block resistance range: 102～⁵×10

Ω/□^-32. Range of resistivity: 102～⁶×10

Ω-cm3. Test current range: 0.1 μ A,1μA，10μA，100µA，1mA，10mA，

100 mA

4. Current accuracy: ± 0.3% reading

5. Resistance accuracy: ≤ 0.5%

6. Display reading: LCD display: resistance, resistivity, square resistance, temperature, unit conversion, temperature coefficient, current, voltage, probe shape, probe spacing, thicknessConductivity7. Testing method

:Ordinary single electrical measurement8. Working power supply

:Input: AC 220V ± 10%, 50Hz power consumption:< 30W9. Uncertainty error of the whole machine

:≤ 4% (standard sample result)10. Selection function:choose2.1.pc3.Software;4.choose

Square probe; choose Linear probe; chooseTesting Platform11. Test probe:Probe spacing selection:1mm；2mm；3mmThree specifications;

Probe material selection: tungsten carbide needle;.

White steel needle; Gold plated phosphor copper hemispherical needle