FISCHERSCOPE XDV-SDD Fluorescent Coating Thickness Gauge

Product description

XDV-SDD has a wide measurement space and is convenient for placing samples. It can accommodate flat samples as well as large samples with complex shapes. Continuous testing or measurement of coating thickness and element distribution can be conveniently completed using a fast programmable XY workbench. The operation is very user-friendly, the measurement door is easy to open, and the front control panel of the instrument has multiple functions, making daily use easy and convenient.

The XDV-SDD instrument is one of the powerful X-ray fluorescence instruments in FISCHER products. It is equipped with a specially enlarged silicon drift detector (SDD). A detector window of 50mm ensures fast and accurate measurement of even small measurement points. In addition, the instrument is equipped with various filters to establish optimized excitation conditions for different measurement tasks. The FISCHERSCOPE XRAY XDVSDD instrument is equipped with a silicon drift receiver with a large sensing area and good resolution. This allows for high counting rates when using a large collimator, achieving good repeatability and extremely low detection limits. XDV-SDD is highly suitable for measuring ultra-thin coatings in trace analysis. Due to the increased sensitivity to low-energy radiation and the expansion of the range of measurable elements to lower atomic numbers, it is possible to reliably measure phosphorus or aluminum in the air.

Application example:

Legal regulations strictly limit the content of various harmful substances, such as electronic components, toys, or packaging materials. XDV-SDD makes it possible to quickly and conveniently detect compliance with these restrictions. For example, the detection limits for particularly important chemical elements such as Pb, Hg, and Cd are only a few ppm.

Harmful substances in metals, such as Pb and Cd in aluminum alloys

Toys: detect Pb, Cd, Hg in them

Feature:

Micro focused X-ray tube with beryllium window and tungsten palladium. *High working conditions: 50kV, 50W
The X-ray detector adopts a Peltier cooled silicon drift detector
Collimators: 4, automatically switchable, ranging from a diameter of 0.1mm to 3mm
Basic filters: 6, programmable XY platform with automatic switching and pop-up function
The video camera can be used to view the measurement position in real time, with calibrated scales on the crosshairs, and the actual size of the measurement points displayed in the image.
The design has obtained permission, comprehensive protection, and complies with Chapter 4, Section 3 of the German X-ray Regulations

Typical application areas:

Measuring ultra-thin coatings, such as in the electronics and semiconductor industries
Trace analysis, such as detecting harmful substances in accordance with RoHS, Toy and Packaging Directive
High precision analysis of gold and precious metals in the photovoltaic industry
Measure the thickness and composition of the NiP layer