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Beijing Jingke Zhichuang Technology Development Co., Ltd
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Beijing Jingke Zhichuang Technology Development Co., Ltd

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    2822343332@qq.com

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    15810615463

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    Mapo Xiangyue Sijisan District, Shunyi District, Beijing

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FE+ferroelectric tester (thin film+bulk+high temperature+probe stage)

NegotiableUpdate on 01/05
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Overview
The FE-5000 ferroelectric tester is a high range device for testing ferroelectric materials. This equipment is suitable for measuring the electrical properties of ferroelectric thin films and bulk materials, and can measure the hysteresis loop of ferroelectric thin films and the values of ferroelectric thin films with asymmetric hysteresis loops. It can perform electrical strain testing, has butterfly curve function, and can also expand functions such as high-temperature resistance, high-temperature dielectric, capacitance voltage curve, TSC/TSDC, etc. This instrument is one of the important equipment for the production, application, and research departments of piezoelectric materials and piezoelectric components, and has been widely used in major universities and research institutes
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FE-5000Type ferroelectric tester

keywords:Hysteresis loop,Ferroelectric tester, voltage, frequency , electrical strain, butterfly curve

FE+铁电测试仪(薄膜+块体+高温+探针台)


1、 Product Introduction:

FE-5000Type ferroelectric testerIt is a high range ferroelectric performance material testing device that can be used for measuring the electrical properties of ferroelectric thin films and ferroelectric materials (both bulk materials). It can measure the hysteresis loop of ferroelectric thin films and measure the values of ferroelectric thin films with asymmetric hysteresis loops.It can perform electrical strain testing and has butterfly curve function,The device can also expand high-temperature resistors and high-temperature dielectrics,capacitance-Voltage curve,TSC/TSDCWaiting for functions.This instrument is one of the important equipment for the production, application, and research of piezoelectric materials and components, and has been widely used in major universities and research institutes.

2、 Main technical indicators:

1. Output signal voltage: ±10 kVScalable electrical response butterfly curve function

2. Temperature; room temperature-200℃, temperature control accuracy: ±1

3. Control the frequency of application0.01to1KHz(Ceramics, single crystals, thin films)PCCustom settings for end software control;

4. Control output current0To ±50mAContinuously adjustable,PCCustom settings for software control on the end.

5. Dynamic hysteresis loop testing frequency range0.01Hz-5kHz

7. The minimum pulse width holding time is20us;The minimum rise time is10us;

8. Fatigue testing frequency500kHz(Amplitude)10 VppLoad capacitance1 nF); Fatigue frequency after using high-voltage amplifier5kHz;

9. Test speed: Measurement time《5second/Sample • Temperature Point

10. Sample specification: Block material size: Diameter2-100mm, thickness0.1-10mm

11Main functions:Dynamic hysteresis loopDHMStatic hysteresis loopSHMI-VCharacteristics, pulsePUND, fatigueFatigueElectric breakdown strengthBDM, leakage currentLM, current-Bias voltage, holding forceRM

10. Charge resolution not less than10 mC;

Leakage current measurement range:1pA~ 20 mAThe resolution should not be lower than0.1pA;

12. Control method: Computer real-time control, real-time display, real-time data calculation, analysis and storage

13. Software collection: Automatic collection software, analysis can be compatible with other related mainstream software.

14. Test accuracy: ±0.05%

15. Built in voltage:±20V

Expandable module

Imprint imprintIM

Variable temperature testTHM

POM module realizes polarization measurement function

CVM module implements small signal capacitance testing to obtainC-Vcurve

PZM module realizes piezoelectric characteristic testing

DPM module testing dielectric performance

RTM module test resistance/Electrical resistivity performance

CCDM module realizes capacitor charging and discharging testing.

FE+铁电测试仪(薄膜+块体+高温+探针台)


Actual measurement data chart (hysteresis loop, leakage current, etc.)


FC-5000And the United StatesTF-2000Comparison chart of test data


FE+铁电测试仪(薄膜+块体+高温+探针台)

FC-5000And the United StatesTF-2000Comparison chart of test data

FE+铁电测试仪(薄膜+块体+高温+探针台)