F10-HC thin film thickness measuring instrument

The F10-HC thin film measurement system developed based on the F20 platform can quickly analyze the reflection spectrum data of thin films and provide measurement thickness. Coupled with the simulation algorithm design of F10-HC software, it can measure single-layer and multi-layer (such as primer or hard coating) in thick films.

Simple operation interface

Now, the F10-HC with the new template mode feature will be easier to use, which allows users to import images of samples and directly define measurement positions on the images. The system will automatically notify the user whether the measurement result is valid and display the measurement result on the imported image for analysis.

No need for manual benchmark calibration

F10-HC can now perform automated benchmark correction and set its own integration time. This innovative method does not require frequent benchmark correction and allows users to immediately perform sample measurements.

Backside reflection interference

Backside reflection interference is an optical technology challenge for thickness measurement. The unique contact probe with F10-HC system can minimize the impact of back side reflection interference, allowing users to measure coating thickness with high accuracy.

Advantages of choosing Filmetrics

Global leader in desktop film thickness measurement

24-hour telephone, email, and online support

All systems use intuitive standard analysis software

Additional features

Embedded online diagnostic method

Free offline analysis software

• Fine historical data functionality helps users effectively store, reproduce, and plot test results