Extended X-ray Absorption Fine Structure Spectrometer

Extended X-ray Absorption Fine Structure SpectrometerThe use of conventional X-ray sources to achieve spectral measurement of X-ray absorption fine structures (XAFS) has a good complementary and expanding effect on major technological infrastructure such as synchrotron radiation, as well as scientific instruments such as electron microscopes and X-ray diffractometers. This product has been selected by many universities such as Peking University, Beihang University, Tianjin University, North China Electric Power University, Qinghai University, Anhui University, etc., effectively assisting in related scientific research and application development!

Compact desktop system, easy to use:

·Support near edge quick scan function;

·Support extended functions such as in-situ testing;

·Ergonomic high design, more convenient operation;

·Built in experimental parameter presets for fast measurement;

·One click automatic switching between different samples and measurement modes;

·Remote data transmission, real-time display of experimental progress and results, supporting unmanned testing;

·Professional application technology support and data analysis support;

·The instrument has radiation exemption qualifications and multiple safety protection interlocks to ensure personal and usage safety.

XAFS specialized bent crystal:

·Complete configuration of different crystal faces to achieve coverage of various elements;

·Pre aligned installation, plug and play;

·Special bent crystals can be customized according to the required elements to achieve optimal performance.

X-ray Absorption Fine Structure (XAFS) SpectrometerExpand X-ray absorption fine structureEnergy scanning mechanism:

·Linkage scanning mechanism;

·Realize precise linkage between light source, bent crystal, sample, and detector;

·High precision and resolution, good stability.