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Address
Room 4527, Block C, Oriental Hope Tianxiang Plaza, No. 500-1, Tianfu Avenue Middle Section, High tech Zone, Chengdu City, Sichuan Province
Gaosmo (Chengdu) International Trade Co., Ltd
Room 4527, Block C, Oriental Hope Tianxiang Plaza, No. 500-1, Tianfu Avenue Middle Section, High tech Zone, Chengdu City, Sichuan Province
Diaphragm thickness gauge
Diaphragm thickness gauge
Have you ever encountered these difficulties when measuring film thickness?
"Unable to complete measurements in real-time on site" "Measurement results vary from person to person" "Measurement accuracy is not satisfactory"?
The intelligent film thickness measuring instrument has the following features to solve all your troubles:
● Handheld design that can be carried around to the production site
● Easy to operate, even newcomers can easily get started
Although it is a handheld device, it can achieve high-precision measurement
● Support non-destructive testing of 3D samples
characteristic
● Handheld devices that can be carried to the site
● Measurable in 0.1 μ m units
Samples with shapes can also be measured non destructively
Regardless of the substrate material, its coating can be measured
measurement project
Measurement range of film thickness |
1μm~50μm |
Measurement repeatability |
0.01μm |
measure time |
Less than 1 second |
Smart handheld film thickness gauge and othersfilm thickness gaugecomparison
● Compared to desktop opticsfilm thickness gaugecomparison, Smartfilm thickness gaugeNon destructive direct measurement of samples can be conducted on-site, and special shaped samples can also be measured.

● Contact basedfilm thickness gaugecomparison, Smartfilm thickness gaugeNot only will it not damage your sample, but it will also not cause errors due to different users, and the measurement accuracy is much higher than that of contact film thickness.

● Compared to eddy current/electromagnetic typefilm thickness gaugecomparison, Smartfilm thickness gaugeNo need to make a measuring line, and can measure non-metallic substrates and obtain absolute values!

No measurement experience is required, and accurate film thickness results can be quickly obtained.

Specification and Style
Measurement principle |
Reflective spectrophotometry (optical interferometry), non-destructive measurement |
Measurement range of film thickness |
1~50 μ m (display upper limit of 60 μ m) |
repeatability accuracy |
2.1σ 0.01μm(SiO2 膜1 μm) |
measurement time |
Within 1 second |
Measure the number of layers |
1st floor |
data output |
Display on the auxiliary operation screen or export Excel files via USB |
Measuring Spot |
Below Φ 1mm |
weight |
About 1.1kg |