Desktop optical profilometer

The SuperViewW desktop optical contour measuring instrument relies on the principle of white light interference and adopts a 3D non-contact measurement mode, which can accurately measure and analyze the key parameters and dimensions of the sample surface morphology. The core measurement results cover the following two categories:
1. Surface morphology parameters: including roughness, flatness, parallelism, step height, cone angle and other multiple indicators;
2. Geometric feature parameters: covering core data such as key aperture size, curvature radius, feature area and volume, feature shape position and quantity.

Product Features of SuperViewW Desktop Optical Contour Measuring Instrument

The SuperViewW desktop optical contour measuring instrument integrates multiple core technologies and user-friendly design, balancing measurement accuracy, ease of operation, and equipment stability. It is suitable for high-precision contour detection needs in multiple scenarios and types of samples, meeting ultra precision measurement conditions.The core product features are as follows:
1. Multifold interference objective lens
Equipped with multiple interference objectives of different magnifications, it can flexibly adapt to various types of sample surface detection. Whether it is ultra smooth surfaces or conventional surfaces with different roughness, it can achieve precise adaptation, covering diverse sample measurement needs and ensuring measurement adaptability under different working conditions.
2. Dual channel air flotation vibration isolation system
Equipped with a dual channel air flotation isolation system, it can be directly inflated and operated through an external air source and pressurization device, effectively blocking various types of vibration noise transmitted from the ground, avoiding the interference of ground vibration on measurement accuracy from the source, and laying a stable foundation for high-precision measurement.
3. Design of Acoustic Vibration Isolation Protection
Adopting a separated design of instrument casing and internal motion mechanism, the transmission path of sound wave vibration is cut off, effectively isolating the influence of external sound wave vibration on internal precision measurement components, further strengthening the anti-interference ability of the equipment, and ensuring stable and error free measurement process.
4. Precision level adjustment device
Equipped with a dedicated tilt adjustment knob, it can flexibly adjust the stripe width, optimize the measurement imaging effect, greatly improve the reconstruction accuracy of 3D images, help obtain clearer and more accurate 3D contour data, and meet the strict requirements of high-precision detection.
5. Ergonomic portable joystick
Adopting a portable joystick design that conforms to ergonomics, the operation is comfortable and effortless; Integrated with automatic control functions for XYZ three-axis displacement, three-axis speed, and light source brightness, the operation is convenient and efficient. It is also equipped with an emergency stop button, which can quickly respond to emergencies and ensure the safety of equipment and samples.
6. Semiconductor specific vacuum adsorption table
Specially designed for semiconductor wafers, the vacuum adsorption table can firmly fix the sample to be tested, avoid the disturbance of weak airflow in the air on the position of the sample during the measurement process, eliminate the problem of sample displacement, and ensure the stability and accuracy of the measurement data.
7. High precision 3D reconstruction algorithm
Equipped with self-developed high-performance 3D reconstruction algorithm, it can automatically filter out various types of noise on the sample surface and optimize the quality of measurement data; Paired with high-performance hardware systems to achieve measurement accuracy, the overall measurement precision can reach sub nanometer level, meeting the top-level requirements of ultra precision contour measurement.

Self developed 3D Microscopic Measurement Software Platform Xtremevision Pro

Xtremevision Pro

The second-generation micro 3D measurement software platform, independently developed, integrates four major functional modules: image scanning, 3D analysis, image measurement, and automated measurement. It can adapt to all 3D instrument models in the Zhongtu W series, VT series, and WT series, and can independently identify the type of model. The two in one model can automatically switch scanning modes in white light interference and confocal microscopes.

Xtremevision Pro has transplanted the successful experience of Zhongtu in the field of image flash measurement and reconstructed the micro image measurement function, which can directly measure and automatically match parameters such as distance, angle, radius between points and lines of micro plane contour dimensions.

Automated Mark Point Recognition Coordinate Localization Automation Function

Mark point image recognition automatic coordinate position correction, multi area coordinate point automatic positioning measurement and analysis, can be combined to complete batch automated measurement of roughness and contour dimensions.

Automatic splicing function

Support automatic stitching measurement function for square, circular, ring, and spiral forms, combined with image navigation function, customizable measurement area, and seamless stitching measurement of thousands of images.

Application field images

SuperViewWDesktop optical profilometerIt can measure and analyze surface morphology features such as roughness, waviness, surface contour, surface defects, wear, corrosion, pore gaps, step height, bending deformation, and processing of various products, components, and materials.

Partial technical indicators

Kind Reminder: Due to market development and product research and development needs, the relevant content of this product information may be updated and revised in a timely manner based on actual circumstances without prior notice. We apologize for any inconvenience caused. If you have any questions or need more details, please feel free to consult Zhongtu Instrument at any time.