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E-mail
hha.contact@hitachi-hightech.com
- Phone
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Address
Building 5, Laigang Xinwan Science and Technology Innovation Park, No. 1601-1609 Li'an Road, Minhang District, Shanghai
Hitachi Analytical Instruments (Shanghai) Co., Ltd
hha.contact@hitachi-hightech.com
Building 5, Laigang Xinwan Science and Technology Innovation Park, No. 1601-1609 Li'an Road, Minhang District, Shanghai
Summary:
FT230Desktop XRF Coating Thickness GaugeThe design greatly reduces the time required for measurement. Hitachi engineers realized that setting up samples and selecting measurement formulas often take a lot of time, so they introduced a groundbreaking analyzer that can effectively 'set up' itself, allowing for the analysis of more parts during the process.
Automation and innovative software areFT230Desktop XRF Coating Thickness GaugeThe characteristics. Intelligent recognition module, such as Find My Part ™ (Search for my samples) means that the operator only needs to load the samples, confirm the parts, and FT230 will handle the rest. It will find the correct measurement position on your component - even on large substrates - select the correct analysis program and send the results to your quality system. Reducing time and human errors allows you to complete more analysis in a shorter amount of time, making efficient inspections more realistic in busy production environments.
Product Highlights
Each part of FT230 is designed to significantly reduce analysis time.
·Automatic focusing reduces sample loading time
· Find My Part ™ Automatically perform intelligent recognition to set up a complete measurement program
·Most of the screen area is used to display sample views, providing decent visibility
·The self checking diagnostic program ensures the condition and stability of the instrument
·Seamless integration with other software enables it to easily export data
·Due to the adoption of a new user interface, non professionals can also use it intuitively and conveniently.
·Powerful function, capable of simultaneously measuring four layers of coatings and analyzing substrates
·Durable and long-lasting in challenging production or laboratory environments
·Complies with ASTM B568 and DIN ISO 3497 standards
·Assist you in meeting the specifications of ENIG (IPC-4552B), ENEPIG (IPC-4556), Immersion Tin (IPC-4554), and Immersion Silver (IPC-4553A)
FT230 desktop XRF analyzer |
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| Element Range | Aluminum (13) - Uranium (92) |
| detector | Silicon Drift Detector (SDD) |
| Sample stage design | Slotting and closing |
| XY Sample Stage Design | Electric or fixed |
| XY sample stage travel | 250 x 200 mm |
| Electric Z-axis travel | 205 mm |
| Maximum sample size | 500 x 400 x 150 mm |
| Number of aligners | 4 |
| Focus laser | Included in standard configuration |
| autofocus | optional |
Make Camera |
optional |
Distance independent measurement |
optional |
Find My Part ™ Intelligent recognition function |
optional |
Coating measurement |
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RoHS screening |
✔️ |
software |
FT Connect |