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Hitachi Analytical Instruments (Shanghai) Co., Ltd
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Hitachi Analytical Instruments (Shanghai) Co., Ltd

  • E-mail

    hha.contact@hitachi-hightech.com

  • Phone

  • Address

    Building 5, Laigang Xinwan Science and Technology Innovation Park, No. 1601-1609 Li'an Road, Minhang District, Shanghai

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Desktop XRF Coating Thickness Gauge

NegotiableUpdate on 12/23
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Overview
The design of the FT230 desktop XRF coating thickness gauge greatly reduces the measurement time. Hitachi engineers realized that setting up samples and selecting measurement formulas often take a lot of time, so they introduced a groundbreaking analyzer that can effectively "set up" itself, allowing for the analysis of more parts during the process. Automation and innovative software are the features of the FT230 analyzer. Intelligent recognition modules, such as Find My Part (Search for my samples) means that the operator only needs to load the samples, confirm the parts, and FT230 will handle the rest.
Product Details

Summary:

FT230Desktop XRF Coating Thickness GaugeThe design greatly reduces the time required for measurement. Hitachi engineers realized that setting up samples and selecting measurement formulas often take a lot of time, so they introduced a groundbreaking analyzer that can effectively 'set up' itself, allowing for the analysis of more parts during the process.


Automation and innovative software areFT230Desktop XRF Coating Thickness GaugeThe characteristics. Intelligent recognition module, such as Find My Part ™ (Search for my samples) means that the operator only needs to load the samples, confirm the parts, and FT230 will handle the rest. It will find the correct measurement position on your component - even on large substrates - select the correct analysis program and send the results to your quality system. Reducing time and human errors allows you to complete more analysis in a shorter amount of time, making efficient inspections more realistic in busy production environments.


Product Highlights

Each part of FT230 is designed to significantly reduce analysis time.

·Automatic focusing reduces sample loading time

· Find My Part ™ Automatically perform intelligent recognition to set up a complete measurement program

·Most of the screen area is used to display sample views, providing decent visibility

·The self checking diagnostic program ensures the condition and stability of the instrument

·Seamless integration with other software enables it to easily export data

·Due to the adoption of a new user interface, non professionals can also use it intuitively and conveniently.

·Powerful function, capable of simultaneously measuring four layers of coatings and analyzing substrates

·Durable and long-lasting in challenging production or laboratory environments

·Complies with ASTM B568 and DIN ISO 3497 standards

·Assist you in meeting the specifications of ENIG (IPC-4552B), ENEPIG (IPC-4556), Immersion Tin (IPC-4554), and Immersion Silver (IPC-4553A)




FT230 desktop XRF analyzer

Element Range

Aluminum (13) - Uranium (92)

detector Silicon Drift Detector (SDD)
Sample stage design Slotting and closing
XY Sample Stage Design

Electric or fixed

XY sample stage travel 250 x 200 mm
Electric Z-axis travel 205 mm
Maximum sample size 500 x 400 x 150 mm
Number of aligners

4

Focus laser

Included in standard configuration

autofocus optional

Make Camera

optional

Distance independent measurement

optional

Find My Part ™ Intelligent recognition function

optional

Coating measurement

✔️

RoHS screening

✔️

software

FT Connect