Desktop X-ray diffractometer

NegotiableUpdate on 05/07

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

The BRAGG desktop X-ray diffractometer, developed, designed, and produced by Beituo Science, adopts advanced X-ray diffraction technology and can quickly and accurately perform crystal structure analysis, phase identification, and quantitative analysis. BRAGG has high resolution and sensitivity, and can handle a variety of sample types, including powders, liquids, solids, etc. It is also equipped with a user-friendly software interface, which facilitates data processing and analysis for users. This instrument is suitable for multiple fields, including materials science, earth science, chemistry, etc., providing researchers and engineers with * analytical tools.

Product Details

Beituo Science specializes in research and development, design, and productionBRAGG desktop X-ray diffractometerBy using X-ray diffraction technology, crystal structure analysis, phase identification, and quantitative analysis can be performed quickly and accurately. BRAGG has high resolution and sensitivity, and can handle a variety of sample types, including powders, liquids, solids, etc. It is also equipped with a user-friendly software interface, which facilitates data processing and analysis for users. This instrument is suitable for multiple fields, including materials science, earth science, chemistry, etc., providing researchers and engineers with * analytical tools.

Instrument features:

Photon counting X-ray detector

Planar photon counting semiconductor detector

High sensitivity, capable of single photon counting

Large dynamic range

Dual threshold

Anti strong radiation long-term exposure, long lifespan

Fixed angle measuring instrument system

Simultaneously obtain images within the -3 °~150 ° 2 θ angle range

2D imaging while collecting gamma angle information

● Large angle arc-shaped detector

Simultaneously obtain images within the -3 °~150 ° 2 θ angle range

2D imaging while collecting gamma angle information

Distance from detector to sample: 150mm

Multi detector seamless coverage at all angles

● Supports multiple data collection modes

Fixed photography mode for obtaining 2D diffraction frames

Obtaining 1D diffraction spectra in fast scan mode

二维超快原位多晶X射线衍射仪

Functional application:

● Phase identification

Quantitative analysis

● Crystallinity

● Cell parameters

● Grain size

● Crystal structure

● Rietveld 精修

● Phase transition

Technical parameters:

	model	BRAGGDesktop X-ray diffractometer
X-ray tube	kind	Cu target (optional target material) metal ceramic tube
X-ray tube	focus	0.4x10/1x10mm interchangeable dots/lines
X-ray generator	Maximum Output	600W
	tube voltage	15~40kV，1kV/Step
	tube current	5~15mA，1mA/Step
	Stability of tube voltage and tube current	≤ 0.01% (power supply voltage fluctuation of 10%)
Angle measuring instrument	Structure of angle measuring instrument	θ/2θ
	Diffraction optical path geometry	Bragg Brentano/Debye Scherrer switchable
	Goniometer radius	150mm
	Scanning/photography angle range	-10~80°(θ)-3~150°(2θ)
	working method	Segmented/fixed photography
	Continuous scanning speed of θ axis	0.125~30°/min
	Maximum speed of θ axis	10°/s
	2 θ angle repeatability accuracy	≤±0.001°
	Measurement accuracy	±0.02
detector	type	Hybrid pixel photon counting semiconductor detector
	pixel dimensions	70x70 μm2
	Unit area	20.1x20.1mm2
	Noise	<1cps
	energy resolution	1000eV
	quantity	11/21 pieces
	Maximum linear count	3x106cps/pixel
cabinet	Cabinet size (mm)	770 (length) x 520 (width) x 800 (height)
	Whole machine weight (kg)	120
	radiation dose	≤ 0.2uSv/h (excluding natural background)
	safety measures	Door interlock protection/power protection/overheating protection
filter	Ni filter	Corresponding to Cu target
comprehensive indicator	Overall stability of the whole machine	≤0.2%