Desktop X-ray absorption spectrometer

Desktop X-ray absorption spectrometer is a desktop analytical instrument that uses a conventional laboratory X-ray light source (rather than synchrotron radiation) to measure the fine structure of X-ray absorption in a regular laboratory. Its goal is to achieve rapid and convenient characterization of the local atomic structure of materials under non synchrotron radiation light source conditions.

Desktop X-ray absorption spectrometer, as a non-destructive analysis technique, has the characteristics of high accuracy and sensitivity, and has been widely used in materials science, chemistry, biology and other fields in recent years.

The core principle is to use the interaction between X-rays and matter to reveal the internal structure and properties of matter. When X-rays pass through a substance, they interact with atoms or molecules in the substance, resulting in phenomena such as absorption and scattering. Desktop X-ray absorption spectrometer can obtain information about the types, contents, and chemical states of elements in substances by accurately measuring the absorption of X-rays at different energies.

The desktop X-ray absorption spectrometer uses conventional X-ray sources to achieve spectral measurement of X-ray absorption fine structures (XAFS), which has a good complementary and expanding effect on major technological infrastructure such as synchrotron radiation, as well as scientific instruments such as electron microscopes and X-ray diffractometers.

　　Compact desktop system, easy to use:

·Support near edge quick scan function;

·Support extended functions such as in-situ testing;

·Ergonomic high design, more convenient operation;

·Built in experimental parameter presets for fast measurement;

·One click automatic switching between different samples and measurement modes;

·Remote data transmission, real-time display of experimental progress and results, supporting unmanned testing;

·Professional application technology support and data analysis support;

·The instrument has radiation exemption qualifications and multiple safety protection interlocks to ensure personal and usage safety.

　　XAFS specialized bent crystal:

·Complete configuration of different crystal faces to achieve coverage of various elements;

·Pre aligned installation, plug and play;

·Special bent crystals can be customized according to the required elements to achieve optimal performance.

　　X-ray absorption fine structure (XAFS) spectrometer X-ray absorption spectrum energy scanning mechanism:

·Linkage scanning mechanism;

·Realize precise linkage between light source, bent crystal, sample, and detector;

·High precision and resolution, good stability.