DEI PVX-2506 pulse generator from the United States

The DEI PVX-2506 pulse generator from the United States is designed specifically for characterizing the pulse volt ampere (current voltage) characteristics of semiconductor devices. Its working specifications can reach 50 volts and 10 amps, and it is also suitable for other applications that require high current and precise voltage pulses. Currently on sale, if you need to make a purchase, please contact us through our customer service hotline!

DEI PVX-2506 pulse generator from the United StatesProduct Introduction
Equipped with instrument level analog voltage and current monitors, suitable for data acquisition, specifically designed for precision pulse driving of semiconductor devices, to meet the requirements of pulse volt ampere characteristic characterization
The PVX-2506 pulse generator is designed specifically for characterizing the pulse volt ampere (current voltage) characteristics of semiconductor devices. Its operating specifications can reach 50 volts and 10 amps, and it is also suitable for other applications that require high current and precise voltage pulses.
The volt ampere characteristics of semiconductor devices are affected by frequency and temperature. The conventional testing method for curve trackers and other "DC" testing systems is to test point by point within a series of gate voltage intervals, and scan the drain voltage within the measurement range at each gate voltage. Under this testing method, the device will reach thermal equilibrium and electronic (semiconductor trap) equilibrium at each testing point, and the resulting test characteristics may differ from the actual RF operating characteristics of the device.
By applying pulses to the device through PVX-2506 and completing measurements during the pulse duration, test data can be obtained before the device heats up. This method avoids the thermal effects caused by traditional "DC" testing, and the measured characteristics are closer to the high-frequency working state of the device, without activating semiconductor "traps".
The PVX-2506 adopts a bidirectional metal oxide semiconductor field-effect transistor (MOSFET) output stage design and is equipped with DEI's DE series high-speed power field-effect transistor. This design can achieve fast rising and falling edges, with minimal overshoot, undershoot, and ringing phenomena, and short setup time. The precisely controlled voltage waveform can stabilize the device under test (DUT) to the set voltage within a few hundred nanoseconds, ensuring that the volt ampere characteristic measurement can be completed before the device starts heating up.
This device can apply static (bias) voltage to keep the tested device in a non-zero voltage state, and then superimpose forward or reverse pulses on top of this voltage. PVX-2506 requires external gate input signal and pulse positive voltage (VHIGH) power supply, and can also be optionally equipped with static low voltage (VLOW) DC power supply. The width and frequency of the output pulse are controlled by the input gate signal, and the amplitude of the output voltage is jointly regulated by the amplitude of the input pulse positive voltage power supply and the amplitude of the selected static low-voltage DC power supply.
The front panel of the device is equipped with control and monitoring components, which support pulse mode operation and can also be switched to DC mode. In DC mode, the DC voltage generated by the pulse positive voltage power supply will be directly applied to the tested device. The device is equipped with instrument level voltage and current probes, which facilitate the collection of pulse data.
The output pulse is transmitted through an innovative low impedance cable, which is designed to ensure the fidelity of the output pulse, without pulse distortion or ringing, and provides a convenient way to connect the pulse generator to the tested device or bias tee. This pulse generator adopts a direct coupling, air-cooled solid-state design, with consistent rising and falling edge velocities, low power consumption, and minimal overshoot, undershoot, and ringing phenomena; Built in overcurrent detection and shutdown circuit can prevent potential damage to equipment caused by arcing or short circuits in loads or interconnecting cables.

Product Features
High specification output, supporting 50V/10A precision pulses, pulse width<1 μ S to 100 μ S
Fast response speed, rising edge<200nS at 50V, establishment time<400nS, low waveform distortion
Dual mode operation, switchable pulse/DC mode, supports static bias voltage application
Equipped with instrument level voltage/current monitoring, BNC interface adapted for data acquisition, high monitoring accuracy
Strong protection, built-in overcurrent detection shutdown circuit, air-cooled solid-state design, low power consumption
Flexible regulation, pulse parameters controlled by external gate signals, supporting single pulse to 50KHz frequency
Application scenarios
The PVX-2506 precision pulse generator core is suitable for characterizing the pulse I-V characteristics of semiconductor devices, avoiding the thermal effects and semiconductor trap activation problems of traditional DC testing, and accurately restoring the true characteristics of the device under high-frequency operation; It is also suitable for various testing scenarios that require high current and high-precision voltage pulses, such as electronic device pulse performance testing, RF device characteristic verification, etc. The supporting monitoring components and low impedance output cables can meet the precise pulse data acquisition and testing needs of the laboratory.

Technical parameters of PVX-2506 pulse generator
All specifications are tested under a 4-foot output cable and a 5-ohm load
input
DC maximum value: 75 volts (floating) DC low value: 0 volts Input connector: rear panel screw terminal
output
Highest specification: 50V/10A Low value: 0V Maximum current: 10A Adjustment method: Controlled by pulse input signal Pulse rise time:<200 nanoseconds (10% -90% amplitude) at 50V Typical setup time:<400 nanoseconds (including rise time) Pulse width:<1 microsecond to 100 microseconds, controlled by gate input signal Frequency range: Single pulse to 50 kHz, controlled by input gate signal Maximum duty cycle: 0.50 (50%) Output connector: 8-pin high current D-type connector
Monitoring output
Voltage Monitoring: Output Ratio 1V/V, Suitable for 1 Megaohm Load Voltage Monitoring Connector: Front Panel BNC Interface Current Monitoring: Output Ratio 0.1A/V, Suitable for 1 Megaohm Load Current Monitoring Connector: Front Panel BNC Interface
Control pulse input
Signal source: External input Input level:+5V ± 1V, suitable for 50 ohm load Rising edge time:<20 nanoseconds Gate input connector: Front panel BNC interface Voltage monitoring connector: Front panel BNC interface
General Parameters
Size: 19 inch rack mount, 8.89 cm x 43.18 cm x 40.64 cm (3.5 inches x 17 inches x 16 inches) Power supply: 100-240 volts AC, 50/60 hertz
*All technical specifications are subject to change without prior notice
Typical test waveform
Typical output waveform for 1 microsecond under 50 volt, 10 ampere, and 5 ohm loads. Typical rising edge and establishment time waveform under 50 volt, 10 ampere, and 5 ohm loads. Typical waveform under 50 kHz, 50 duty cycle, 50 volt, 10 ampere, and 5 ohm loads