Comprehensive testing instrument for ferroelectric properties of thin films

FETS-2000bComprehensive testing instrument for ferroelectric properties of thin filmsIt has testing functions for dynamic hysteresis loop (DHM), I-V characteristics, pulse (PUND), static hysteresis loop (SHM), fatigue (FM), leakage current (LM), current bias, holding force (RM), and imprint (IM) It can be widely applied in research fields such as various ferroelectric/piezoelectric/pyroelectric thin films, thick films, bulk materials and electronic ceramics, ferroelectric sensors/actuators/memories, etc.

FETS-2000bComprehensive testing instrument for ferroelectric properties of thin filmsUsed in conjunction with the probe station, it can achieve ferroelectric performance testing of thin films. The dynamic hysteresis loop test frequency and excitation test power supply can be selected by users according to their needs. The dynamic hysteresis loop test frequency range is 1mHz to 500kHz, and the excitation can be selectedtestPower supply ± 10/30/100/200/500VAC optional, can also be customized according to user needs.

This testing system consists of a main controller, probe station, computer, and system software. The main controller integrates built-inIncentive testing power supplyThe system software includes functions such as charge integrator, programmable amplifier, analog-to-digital converter, communication bus, etc. The system software includes visual data acquisition and management functions. During testing, hysteresis, pulse, leakage, IV and other performance tests can be achieved without changing the connection of the test sample.

The ferroelectric performance testing of this testing system adopts an improved approachSawyer- TowerCompared with the traditional Sawyer Tower mode, this circuit eliminates external capacitors and reduces the influence of parasitic components in the measurement method. The testing accuracy of this circuit depends only on the accuracy of the integrator capacitor, reducing the impact on the testing process, making it easy to calibrate and calibrate, and achieving high measurement accuracy.

This system provides an interface for external high-voltage amplifiers, which can be directly extended for users who need to perform high-voltage testing and high-voltage leakage current testing.

Users who choose this device need to provide the manufacturer with requirements such as testing frequency and excitation testing voltage.

Testing function:

• Dynamic hysteresis loop (DHM)

• I-V characteristics

• Pulse (PUND)

• Static hysteresis loop (SHM)

• Fatigue (FM)

• Leakage current (LM)

• Current bias voltage

• Retention Force (RM)

• Imprint (IM)

Scalable components:

• probe station