Cold and hot shock rapid temperature change test chamber SER

Cold and hot shock rapid temperature change test chamber SERFor different electronic components, changing the temperature difference range and rapid temperature changes encountered in actual use environments can provide a more rigorous testing environment, shorten testing time, and reduce testing costs. However, attention must be paid to the potential additional impact on material testing, resulting in non use state destructive tests. The RAMP test conditions are indicated as: Temperature Cycling or Temperature Cycling Test, which refers to temperature cycling (temperature shock with controllable slope), while the failure mechanism remains unaffected.

productFeatures:

1. Capable of performing AMP (equal temperature change), three box shock (TC), two box shock (TS), high temperature storage, and low temperature storage functions;

2. The average temperature rate of Saisi can be set within a range of 5 ℃ to 30 ℃/min (40 ℃/min);

3. Meet the testing requirements for lead-free processes, lead-free soldering, solder whiskers (whiskers), DELL D4559, MOTO, IEC-60068-2-14NB, JESC22-A14C, IPC-9701, etc;

4. Saisi adopts Sporlan's new PWM cold control technology from the United States to achieve low-temperature energy-saving operation;

5. The defrosting cycle is once every three days, and each time it only takes one hour to complete;

6. Communication configuration includes RS232 interface and USB storage curve download function;

7. The placement of sensors in the test area's air outlet (return) is in line with the experimental effectiveness of the Saisi design;

8. Multiple alarm monitoring on the machine, equipped with wireless remote alarm function;

Cold and hot shock rapid temperature change test chamber SERTechnical Specifications: