Brooke BRUKER X-ray diffractometer XRD D8

Bruker X-ray diffraction XRD

D8 ADVANCE

Brooke BRUKER X-ray diffractometer XRD D8 ADVANCEIt is an X-ray diffraction instrument based on the D8 diffractometer series platform, which is the ideal choice for all X-ray powder diffraction and scattering applications, and can easily adapt to various analysis needs. The device has a higher counting rate, dynamic range, and energy resolution, and has excellent data quality in almost all dimensions.

Adopting an open design and featuring unconstrained modularity, as well as better user friendliness, ease of operation, and safe operation, ≤ 0.01 ° 2HThe peak position accuracy provides alignment assurance for the geometric dimensions and wavelengths of the instrument throughout the entire angular range.

Future oriented X-ray diffraction solution

Brooke BRUKER X-ray diffractometer XRD D8 ADVANCEVery suitable for X-ray powder diffraction and scattering applications, including typical X-ray powder diffraction (XRD), distribution function (PDF) analysis, as well as small angle X-ray scattering (SAXS) and wide-angle X-ray scattering (WAXS).

Due to its excellent adaptability, with only D8 ADVANCE, you can measure all types of samples: from liquids to powders, from films to solid blocks.

Both novice and expert users can easily and quickly make configuration changes without errors. This is all achieved through Brooke's unique DAVINCI design: when configuring instruments, there is no need for tools or alignment, and it is also supported by automated real-time component recognition and verification.

More importantly, Brooke Company can provide alignment assurance for the geometric dimensions and wavelengths of the instrument throughout the entire angular range.

TWIN / TWINoptical path

Brooke's TWIN-TWIN optical path design effectively simplifies the operation of D8 ADVANCE, making it suitable for various applications and sample types. For user convenience, the system can automatically switch between four different beam geometries. The system can switch between Bragg Brentano powder diffraction geometry and parallel beam geometry of poorly shaped samples, coatings, and films without manual intervention. It is capable of analyzing various types of samples, including powders, bulk objects, fibers, sheets, and thin films (amorphous, polycrystalline, and epitaxial), in both ambient and non ambient conditions.

Dynamic Beam Optimization (DBO)

Brooke's DBO function sets a new important benchmark for the data quality of X-ray diffraction, automatically obtaining powder data. Simply input the sample size, and DBO will dynamically adjust the motor-driven diverging slit, anti scatter screen, and detector window.

The automatic synchronization function of motor-driven diverging slits, anti scatter screens, and variable detector windows can provide you with better data quality, especially in low 2HAt the angle. In addition, the entire series of LYNXEYE detectors support DBO: SSD160-2, LYNXEYE-2, and LYNXEYE XE-T.

LYNXEYE XE-Tdetector

LYNXEYE XE-T is the flagship product of the LYNXEYE series detectors. It is an energy dispersive detector that can collect 0D, 1D, and 2D data, suitable for all wavelengths (from Cr to Ag), with higher counting rates and better angular resolution, making it an ideal choice for X-ray diffraction and scattering applications. In terms of 0D, 1D, and 2D data acquisition, LYNXEYE XE-T has excellent and consistently effective energy discrimination capabilities, without the typical signal loss of a two-stage monochromator.

LYNXEYE XE-T is a fluorescence filter detector system with energy resolution better than 380 eV. With it, users can achieve 100% filtering of iron fluorescence excited by copper radiation without the need for metal filters, thus eliminating artifacts such as residual K ß and absorption edges in the data. Similarly, there is no need for a secondary monochromator that can eliminate intensity.

Brooke provides LYNXEYE XE-T detector guarantee: no bad channels guaranteed upon delivery!

More features and advantages

· DAVINCIdesignThe high-precision quick locking mechanism, three-point support installation of optical components, and ID chip with component recognition function have the advantages of failure protection and avoiding optical path alignment during component replacement.

· TRIOOptical path and TWIN optical pathIt can automatically switch between up to 6 different beam geometries without human intervention.

· EIGER2 RdetectorEquipped with panoramic solar slit components and vacuum transmission pipelines for 0D, 1D, and 2D data acquisition

· Solution for Compliance LaboratorySolutions and device certification services that comply with cGAMP, 21CFR Part 11, and EU Annex 11.

· Instrument quality and data qualityProvide instrument alignment assurance to ensure that the entire system (not just individual components) meets the high standards outlined in the Instrument Performance Verification Manual.

D8 ADVANCEApplication - Powder Diffraction

X-ray powder diffraction (XRPD) technology is one of the important material characterization tools. Many pieces of information in powder diffraction patterns are directly derived from the atomic arrangement of the phase. With the support of D8 ADVANCE and DIFFRAC.SUITE software, you will be able to easily implement common XRPD methods:

·Identify crystalline and amorphous phases and determine sample purity

·Quantitative analysis of crystalline and amorphous phases in multiphase mixtures

·Microstructure analysis (microcrystalline size, microstrain, disorder...)

·A large amount of residual stress generated by heat treatment or processing manufacturing components

·Texture (preferred orientation) analysis

·Indicator based, de novo crystal structure determination, and crystal structure refinement

D8 ADVANCEApplication - Analysis of Distribution Functions

Distribution function (PDF) analysis is an analytical technique that provides structural information of disordered materials based on Bragg and diffuse scattering ("total scattering"). Among them, you can obtain information about the average crystal structure of the material (i.e. long-range order) through Bragg diffraction peaks, and characterize its local structure (i.e. short-range order) through diffuse scattering.

In terms of analysis speed, data quality, and analysis results for amorphous, weak crystalline, nanocrystalline, or nanostructured materials, D8 ADVANCE and TOPAS software represent the best performing PDF analysis solutions on the market:

·Phase identification

·Structural determination and refinement

·Nanoparticle size and shape

D8 ADVANCEApplication - Thin Films and Coatings

The principle used for thin film and coating analysis is the same as XRPD, but further provides beam adjustment and angle control functions. Typical examples include but are not limited to phase identification, crystal quality, residual stress, texture analysis, thickness determination, and composition and strain analysis. When analyzing thin films and coatings, emphasis is placed on the characteristic analysis of layered materials with thicknesses between nm and µ m (from amorphous and polycrystalline coatings to epitaxial growth thin films). D8 ADVANCE and DIFFRAC.SUITE software can perform high-quality thin film analysis as follows:

·Grazing incidence diffraction

·X-ray reflection method

·High resolution X-ray diffraction

·Reverse space scanning

D8 ADVANCEApplication - Scope of Application

Phase identificationMaterial Reliability Identification (PMI) is more common because it is highly sensitive to atomic structure, which cannot be achieved through elemental analysis techniques.

Quantitative phase analysisThe methods include semi quantitative analysis using EVA software, area analysis using DQUANT software, and full spectrum fitting analysis using DIFFRACTOPOS software.

Generation and improvement of paired distribution functionDIFFRAC.TOPAS integrates unique PDF generation and refinement methods, making it a true "raw data to PDF refinement" solution.

Non environmental XRDTemperature curves can be configured in DIFFRAC.WIZARD and synchronized with measurements, and the results can be displayed in DIFFRAC.EVA.

Texture analysisIn DIFFRAC.TEXTURE software, use spherical harmonics and component analysis methods to generate polar plots, orientation distribution functions (ODFs), and volume quantification analysis.

Residual stress analysisAnalyze the residual stress of steel components in DIFFRAC.LEPTOS using the sin2psi method and measure it using Cr radiation.

XRay reflection method(XRR): XRR analysis of film thickness, interface roughness, and density of multi-layer samples in DIFFRAC.LEPTOS

Small angle X-ray scattering(SAXS): Particle size analysis was performed on NIST standard SRM 80119nm gold nanoparticles collected in 2D mode using EIGER2 R500K in DIFFRAC.SAXS.

Phase identification&residual stress analysis

D8 ADVANCEApplication - Industry Applications

· metal industry

Residual austenite, residual stress, and texture testing are common testing items in metal samples, with the aim of ensuring that the product meets the user's requirements.

· Thin film metrology

Samples ranging from micrometer thickness coatings to nanometer thickness epitaxial films benefit from a range of techniques used to evaluate crystal quality, film thickness, composition epitaxial arrangement, and strain relaxation.

· building materials

XRD plays a crucial role in ensuring high yield of target products, including clinker analysis and reaction monitoring, from raw materials to quality control.

· Pharmaceutical industry

From drug discovery to drug production, D8ADVANCE provides support for the entire lifecycle of drugs, including structural determination, reliable identification of materials, formulation quantification, and non environmental stability testing.

· Chemical products/pigments

These industries typically require the determination of new structures or quantitative analysis of mixtures for a large amount of industrial materials, including analysis of major and minor phase components.

· Energy storage/battery

By using D8 ADVANCE, battery materials can be tested under in-situ cycling conditions, allowing for intuitive understanding of the continuous changes in crystal structure and phase composition of energy storage materials.