Automatic Transformer Testing System

Changzhou Tonghui Electronics has successfully adopted the new generation technology based on years of experience in transformer testingAutomatic Transformer Testing SystemInnovatively adopting a new generation of technologies such as dual CPU architecture, Linux underlying system, 10.1-inch capacitive touch screen, Chinese and English operating interface, built-in instructions and help, etc., it solves the shortcomings of previous testing systems such as cumbersome setup, slow testing speed, display completion, and insufficient PIN pin positions.

TH2840AXTH2840BXTH2840NXAutomatic Transformer Testing SystemThanks to the use of a 10.1-inch capacitive touch screen with a resolution of 1280 * 800, all pin settings, testing conditions, pin series and parallel connections, and balance settings can be operated on the same screen, simplifying the setup process and reducing the difficulty for instrument operators to set up.

A. Revolutionary design

Dual CPU architecture, Linux underlying, supports touch screen, keyboard, mouse, built-in Chinese and English help design, etc;

Greatly reducing the entry threshold for operators and improving testing efficiency several times.

B. 10.1-inch large screen simplifies setup efficiency and reduces operational difficulty

A 10.1-inch touch screen with a resolution of 1280 * 800, the touch sensitive large screen brings more benefits, such as placing all transformer pin associations, testing parameters, pin series and parallel connections, sorting parameters and other parameters on the same screen, which can be directly operated by hand or keyboard and mouse. Not only is the operation fast, but it also looks less crowded and cluttered.

Based on more than ten years of cultivation in the field of transformer testing by Tonghui Electronics, we have been continuously improving the early automatic transformer comprehensive testing system to address the problems encountered during testing.

1. TH2840AXTH2840BXTH2840NX Graphic Transformer Pin Association Page

In the early days, the setting of the foot position association page was cumbersome, and it was difficult to match the transformer foot position and the test fixture foot position one by one in the first place, making the setting difficult.

In response to this problem, the new generationAutomatic Transformer Testing SystemAdded elements such as images, colors, and borders to the foot position association interface, enhancing the correlation between foot position settings and test cow horns. Users can immediately associate transformer foot positions with physical objects, reducing the difficulty of setting and the possibility of wiring errors.

2. Single page setting of transformer testing conditions

Setting test parameters in the early stages requires entering different settings pages, such as setting Lx related parameters, which requires entering 6-7 different sub pages and is quite cumbersome.

After improvement, multiple parameters can now be switched on one page, and all related parameters of Lx can be set in one table, which is clear at a glance and greatly improves the efficiency of setting.

3. TH2840AXTH2840BX TH2840NX improves pin series and parallel settings. When setting pin positions in early models, it is necessary to enter different sub pages for both series and parallel pin positions.

After improvement, the pin positions can be set in series and parallel directly on one page

4. TH2840AX TH2840BX TH2840NX The improved multi pin input method often requires the input of multiple consecutive pins such as 1, 2, 3, 4, 5, and 6 during transformer scanning settings. Therefore, the input method has been improved by using habitual representations of continuous input such as 1 to 6, simplifying the display page and improving input efficiency.

5. TH2840AX TH2840BX TH2840NX Increase the average number of times and delay settings for each scanning parameter to increase stability

During transformer scanning testing, due to the large inductance of some inductance circuits, it takes a certain amount of time to stabilize before accurate values can be read. In response to this situation, the average number of times and delay settings have been added to each scanning parameter to increase stability, without affecting the testing speed of other parameters

6. Change the TH2840AX TH2840BX TH2840NX leakage inductance setting method. When testing leakage inductance Lk in multiple windings, early instruments needed to constantly switch corresponding windings and set nominal and limit values, which was very troublesome. The new generation has improved this setting method by directly setting the pin positions and connection methods of different secondary windings on the same setting page, eliminating the need for input leakage inductance pins. The nominal value and upper and lower limits can be directly input at the corresponding pins

7. TH2840AX TH2840BX TH2840NX has improved the balance scanning method for testing the balance of multi winding transformers. Similar to testing leakage inductance, early instruments required continuous switching of secondary balance pins and setting corresponding limit values. The new generation has improved this setting by allowing all balance setting items to be set on the same page. In response to the previous shortage of only 5 balance points, it has been upgraded to 10 points

C. LCR measurement function

1. This function is an optional feature

2. For detailed functions and indicators, please refer to the technical parameters of TH2840 series LCR digital bridge

TH2840AXTH2840BXTH2840NX Application

Scanning test and comprehensive characteristic analysis of switch transformers

Network transformer scanning test, comprehensive characteristic analysis

Discrete passive components (inductance L, resistance R, capacitance C) multi-channel scanning test

Multi channel scanning test for relay drive wire package and contact resistance of contacts

Multi channel DC resistance DCR scanning test

Comprehensive testing and analysis of multiple passive components in impedance networks