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Boyue Instrument (Shanghai) Co., Ltd
Atomic Force Microscope Dimension Icon
NegotiableUpdate on 02/11
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Overview
The Atomic Force Microscope Dimension Icon (Bruker Dimension Icon) is a high-performance atomic force microscope with intelligent imaging mode (Scan Asyst) and large sample stage. It brings a new application experience to researchers in the nanoscale fields of industry and research, with higher levels of performance, multiple different functions and accessory choices, powerful testing functions, and easy operation.
Product Details
Atomic Force Microscope Dimension Icon-Atomic force microscope with excellent performance, intelligent imaging mode (Scan Asyst) and large sample stage
User Dimension ® Icon™ Atomic force microscopy has brought a new application experience to researchers in the nanoscale fields of industry and research, with higher levels of performance, a variety of different functions and accessory choices, powerful testing capabilities, and easy operation.
By gathering togetherDimensionWith decades of technical experience, extensive customer feedback, and combined with equipment requirements in the industrial field,Dimension IconA comprehensive reform has been carried out. The brand new system design achieves a higher level of low drift and low noise. Now, users only need a few minutes to obtain real and accurate scanned images.
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