AixACCT TF-2000E Ferroelectric Analyzer

aixACCT TF-2000EFerroelectric Analyzer

Main technical parameters:

Voltage: ± 30V, current: 1pA~1A, test frequency: 0.001Hz-5kHz, maximum fatigue frequency: 300kHz

Thin film testing capability: ferroelectric and pyroelectric properties within -196 ℃ to 600 ℃, voltage ± 30V, current 1pA~1A, frequency 0.001Hz~5kHz

Block testing capability: ferroelectric, piezoelectric, and pyroelectric properties at RT-600 ℃, voltage ± 10kV, current 1pA~10mA, frequency within 0.001Hz~5kHz

Ferroelectric testing capability: static hysteresis loop, initial hysteresis loop, hysteresis IV curve, loss curve, variable temperature automatic testing function

Piezoelectric testing capability: Butterfly curve, small signal d33-V curve, curve of piezoelectric characteristic values changing automatically with temperature (variable temperature piezoelectric)

Thin film variable temperature testing fixture: four probe bracket

Application scope:

Precision measurement of dielectric constant as a function of frequency and temperature

Capable of testing the hysteresis loop of bulk and thin film materials under high electric fields

Key Features:

modular design

Accurate measurement over a wide temperature and frequency range

Dielectric parameter analysis function

Easy to use and universal PC connection