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Hangzhou Daji Optoelectronic Instrument Co., Ltd
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Hangzhou Daji Optoelectronic Instrument Co., Ltd

  • E-mail

    452915414@qq.com

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  • Address

    No. 200 Zhenhua Road, Xihu Science and Technology Park, Hangzhou City

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Advanced Leaf Area Analysis and Measurement Instrument

NegotiableUpdate on 02/07
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Overview
Used for plant leaf area analysis, etc
Product Details

1. Equipped with a 12 megapixel camera with a large depth of field and a 5V mobile power supply auxiliary backlight board with>10000mAH, it can provide outdoor backlight illumination for 3 hours. The standard maximum measurement area is 380 * 265mm, with automatic calibration and image correction.

2. One click operation for photography and analysis, while analyzing the leaf area, perimeter, maximum leaf length, maximum leaf width, rectangularity, concavity convexity ratio, sphericity, shape factor, number of wormholes, insect damage and wormhole leaf area of multiple leaves, as well as parameters such as leaf holes, shape factor, sawtooth number, petiole length and width of a single leaf, and marking the edge of the leaf for accuracy verification.

3. It can analyze blades as small as 1mm ^ 2, with an analysis error of less than 0.5% and an analysis time of less than 2 seconds during measurement. It can automatically and independently mark each blade and save the graph. The analysis results can be output to an Excel spreadsheet.

4. It can automatically measure the length, width, and projected area of ordinary seeds such as rice, wheat, and melon seeds that do not collide with each other.