3D Ray Microscope Zeiss Xradia 510 Vers

3D Ray Microscope Zeiss Xradia 510 Vers3D sub micron imaging system with breakthrough flexibility

Use this X-ray microscope to break down the barrier of 1 micron resolution for 3D imaging and in situ/4D research.

Combining resolution and contrast with flexible working distance can expand non-destructive imaging capabilities in the laboratory.

Thanks to its two-stage amplification technology structure, it can achieve sub micron resolution at long distances (RaaD). Reduce dependence on geometric magnification and maintain sub micron resolution even at larger working distances.

Even at a large working distance from the light source (from millimeters to centimeters), versatility can still be enjoyed.

3D imaging of soft or low-Z materials through advanced absorption capability and innovative phase contrast

Resolution achieved at flexible working distances beyond the limitations of projection based micro CT

Addressing sub micron level features to accommodate various sample sizes

Expand non-destructive imaging in the laboratory using in-situ/4D solutions

Investigate materials in the environment similar to this machine over time

Throughput of image quality

Zeiss Reconstruction Toolbox for better image quality and higher throughput

Advanced Reconstruction Toolbox is an innovative platform on the Zeiss Xradia 3D X-ray microscope that can be used to access reconstruction techniques. The module fully utilizes a profound understanding of X-ray physics principles and customer applications to solve the most challenging imaging challenges in a novel way.

You can find information about new technological advancements in X-ray microscopy here:

Using the 'Reconstruction Toolbox', you can:

Improve data collection and analysis for accurate and rapid decision-making

Greatly improve image quality

Achieve excellent internal tomography or flux on multiple samples

Revealing subtle differences by improving contrast

For sample categories that require repetitive workflows, increase the speed by an order of magnitude

Using AI to Advance Reconstruction Technology for Supercharging 3D X-ray Imaging

One of the main challenges in using X-ray microscopes to solve academic and industrial problems is to strike a balance between imaging flux and image quality. The acquisition time of high-resolution 3D X-ray microscopy may be on the order of several hours, which can result in extremely challenging return on investment (ROI) calculations when weighing the relative advantages of high-precision 3D analysis using inexpensive and poorly performing analysis techniques.

To address this issue, it is necessary to optimize each step of generating actionable information from these microscopes. For 3D X-ray tomography, these steps typically include sample installation, scan setup, 2D projection image acquisition, 2D to 3D image reconstruction, image post-processing and segmentation, and final analysis.

　　3D Ray Microscope Zeiss Xradia 510 VersThe imaging flux of repeated samples is 10 times faster

ZEISS DeepRecon for ZEISS Xradia XRM is a commercially available deep learning reconstruction technique. It allows you to increase throughput by an order of magnitude (10 times higher) without sacrificing novel XRM long-range resolution for repetitive workflow applications. DeepRecon collects hidden opportunities in big data generated by XRM and provides significant speed or image quality improvements driven by AI.