New choice for high-quality characterization and sample preparation, Zeiss Crossbeam 330 FIB-SEM officially released!

Focused ion beam products areThe core tool for the transformation of material research and development from "experience driven" to "data-driven", inMaterials Science, Life Science, Industrial TestingsemiconductorFields such as failure analysisPlaying an irreplaceable role，ButHigh quality characterization, sample preparation, and 3D reconstructionpositiveIt is its broad and core application scenario.

Zeiss continues to deepen its localization strategy and, starting from the Chinese market, has launched a new focused ion beam scanning electron microscope Crossbeam 330 to meet the localization needs of scientific research.Crossbeam 330 is tailor-made for core scenarios such as high-quality characterization and sample preparation,By deeply integrating electronic and ion tubes, it comprehensively covers high-quality imaging/cross-sectional analysis, TEM sample preparationmicro、 Application requirements such as 3D representation.The specially designed magnetic tube without leakage and the acceleration and deceleration technology inside the tube can easily adapt to complex samples such as magnetic and non-conductive materials, without the need for complex preprocessing, and can be monitored in real time during the processing, achieving high-resolution characterization and precise machining.

three majorspecialty：

01

“strong” characterization：The high-quality imaging and comprehensive sample compatibility brought by the classic Gemini electro-optical system allow you to achieve comparable excellence in FIBSEM imaging experience

02

Quick preparation：Good characterization ability combined with high-throughput ion guns can achieve rapid cross-sectional sample preparation and high-quality characterization of subsurface structures

03

Easy TEM: ExtraordinaryThe ion beam performance ensures easy preparation of high-quality TEM thin film samples; Equipped with newly developed automated processes and user-friendly software, the challenges of preparing TEM thin film samples can be significantly reduced.

From macroscopic overall analysis to in-depth exploration of microscopic mechanisms, cutting-edge research is rapidly developing towards cross scale and multi-dimensional directions. The complex and systematic representation requirements have become the core characteristics of scientific breakthroughs and industrial innovation, but also bring practical challenges such as data fragmentation, complex multi device operation, and fragmented analysis processes.

Crossbeam The 330 can seamlessly integrate into Zeiss's cross scale, multimodal comprehensive characterization solutions, leveraging the unique characterization advantages of deep linkage optical microscopes, X-ray microscopes, and other equipment, achieving automation from centimeter to nanometer scalesROIContinuous characterization and multimodal analysis，Breaking down technical barriers between devices，Systematically addressing complex research requirements.

Seamless integration into multi-scale research, systematically addressing complex research needs:

The correlation process between X-ray microscopy and focused ion beam scanning electron microscopy (XRM-FIB) enables the localization, exposure, characterization, and analysis of battery pollutants

The all-new Zeiss focused ion beam scanning electron microscope Crossbeam 330, with its excellent imaging and sample preparation capabilities, more intelligent operating procedures, and multimodal integration platform, is a great choice forNew materials, metals, new energy, earth sciences, electronic semiconductors, and life sciences, etcWe provide efficient and reliable one-stop characterization and processing solutions in cutting-edge fields, helping you achieve higher-level scientific breakthroughs and industrial upgrades.