Feina desktop field emission scanning electron microscope landing at Sinochem International: precise detection of plastic defects, helping to upgrade the chemical industry

Recently, Shanghai Sinochem Technology Co., Ltd. (referred to as "Sinochem"), a subsidiary of Sinochem International, successfully introduced the Pharos STEM field emission scanning electron microscope and completed the installation acceptance and operation smoothly. The deployment of this equipment will help enterprises control the defects of plastic products, observe the core-shell structure of catalysts, and provide strong technical support for ensuring the high-quality development of the chemical industry.

Pharos STEM Field Emission Scanning Transmission Electron Microscope

About Shanghai Sinochem Technology Co., Ltd

Shanghai Sinochem Technology Co., Ltd. is a wholly-owned subsidiary of China National Chemical Corporation Limited. As a wholly-owned subsidiary of Sinochem International (Holdings) Co., Ltd., Shanghai Sinochem Technology Co., Ltd. focuses on research and innovation in the field of new materials and is committed to promoting the industrialization of scientific and technological achievements. The company adheres to the concept of "science first" and is committed to building a technology driven innovative enterprise. It conducts research and development innovation in the field of new materials, fully utilizes resources, and forms a complete industrial chain around key scientific research projects.

The company has a relatively complete R&D platform, including functional material platform, composite material platform, analysis and testing center, and application development center. These platforms support the company's research and innovation in the field of new materials, promoting the transformation and industrialization of technological achievements.

In the field of electron microscopy, field emission scanning electron microscopy has always been regarded as a representative of scientific research instruments. For a long time, ground-based field emission electron microscopes have been deterred by researchers and enterprises due to their large volume, complex structure, and high requirements for laboratory environments, which require additional shock-absorbing platforms and magnetic shielding devices. However, with its design, the Feina electron microscope successfully overcame these difficulties.

The Feina desktop field emission scanning electron microscope is shockproof and magnetic resistant, and can be directly installed on ordinary experimental tables. Adopting high brightness and long lifespan field emission filaments, the filament lifespan can reach 10000 hours or even higher, with high image clarity and a maximum resolution of 1-2nm. The equipment has good expandability, and by adding STEM detectors, some functions of transmission electron microscopy can be achieved without modifying the equipment itself.

Observation of microstructure of plastic products and catalysts

This time, the Pharos STEM field emission scanning transmission electron microscope introduced by Sinochem is mainly used for structural observation, element analysis, and defect detection of plastic products, as well as observation of the core-shell structure of catalysts, providing more accurate and efficient analytical methods for product quality control.

Plastic materials are widely used in key industries such as automobiles, electronics, healthcare, and aviation. The key properties such as mechanical properties, heat resistance, and processing stability often depend on the microstructure. Structural defects such as holes and cracks in plastic materials, if not identified and controlled in a timely manner, can easily become the starting point for product failure. Scanning electron microscopy can perform high-precision imaging and analysis of these defects, providing strong support for material formulation optimization and process improvement.

Graphene 50000x under scanning electron microscopy (SED image)

At the same time, the performance of catalysts is largely limited by their internal structure, especially the precise control of the core-shell structure. The core-shell structure catalyst achieves multiple improvements in catalytic activity, selectivity, and stability by encapsulating a functional shell layer around the active core. Structural observation techniques, such as scanning transmission electron microscopy (STEM) and energy dispersive spectroscopy (EDS), can clearly reveal the interface structure of various phases inside the catalyst, verify the uniformity of core-shell distribution and element gradient, and directly affect its application effect in green chemistry, fine synthesis, and carbon neutrality processes.

Catalyst 100000x (SEM SED image)

Catalyst 200000x (Scanning Electron Microscopy STEM Mode)

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The relevant person in charge of China National Chemical Corporation stated that the introduction of the Feina desktop field emission scanning electron microscope series will effectively improve the observation ability of product microstructure and provide strong technical support for the high-quality development of the chemical industry.

01 Schottky field emission electron source

Field emission electron microscopy has distinct advantages, such as small color difference in electron beam energy, high beam density, resolution up to the Å level, and a filament lifespan of up to 10000 hours. The Feina desktop field emission scanning electron microscope integrates resolution, stability, and operability. The high brightness Schottky field emission filament is integrated into the desktop scanning electron microscope, equipped with STEM detectors, which increases the resolution of the desktop electron microscope to 1nm.

02 15 second vacuum pumping, 30 second ultra fast imaging

Phenom desktop electron microscope sample cup, low vacuum design, vacuum technology, completes vacuuming within 15 seconds after loading the sample, and high-quality images can be obtained within 30 seconds, taking only about 1/10 of traditional electron microscopes.

03 Earthquake resistant, no need to worry even when placed on high floors

The desktop design of the Feina electron microscope has no special requirements for the surrounding environment and can be placed on ordinary desks in high-rise offices, factories, and other places without the need for seismic facilities. It is one of the few truly seismic electron microscopes.

04 Intelligent operation doubles testing efficiency

Phenom Pharos adopts an intelligent operating interface, allowing even beginners to quickly get started and easily obtain high-quality images and data. At the same time, its automation function can reduce human operation errors, improve the accuracy and reliability of detection.

The successful installation of the Feina electron microscope at Sinochem has opened a new chapter in the exploration of the microscopic world and brought new opportunities for the research of plastics and catalysts. We look forward to this advanced scientific research equipment further establishing a bridge between microstructure and product performance, making greater contributions to the chemical industry.