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Specially invited Stele experts to share: Sample preparation and failure analysis techniques in the electronic semiconductor industry
Date: 2025-06-09Read: 2

In the electronic semiconductor industry, sample preparation is crucial for failure analysis. The sample preparation equipment provided by Steele, such as precision cutting, vacuum impregnation embedding, and mechanical polishing, ensures the best processing effect before sample analysis. The use of argon ion grinder can perform stress free polishing or cutting treatment on the sample, which facilitates high-resolution and rapid analysis of subsequent scanning electron microscopy to deeply analyze the microstructure and properties of the material and find the cause of failure.

This conference specially invited application experts from SITEL to share cutting-edge industry technologies and analyze practical cases, helping participants improve their professional skills and promote technological innovation and industrial upgrading in the electronic semiconductor industry. We cordially invite you to attend.

Meeting Theme

Webinar on Electronic Semiconductor Sample Preparation and Failure Analysis

meeting time

June 18, 2025 14:00-15:30

Participation method

Identify the QR code below to register and attend for free


特邀司特尔专家分享:电子半导体行业样品制备和失效分析技术

workflow

1. Secotom Precision Cutting Machine

特邀司特尔专家分享:电子半导体行业样品制备和失效分析技术

2. CitoVac Cold Embedding Vacuum Impregnation Instrument

特邀司特尔专家分享:电子半导体行业样品制备和失效分析技术

3. Stegramin-30 automatic grinding and polishing machine

特邀司特尔专家分享:电子半导体行业样品制备和失效分析技术

4. Technoorg Linda SMART ion grinder

特邀司特尔专家分享:电子半导体行业样品制备和失效分析技术

5. Field emission scanning electron microscope with Feina platform

特邀司特尔专家分享:电子半导体行业样品制备和失效分析技术

Case Showcase

特邀司特尔专家分享:电子半导体行业样品制备和失效分析技术

The results of processing multi-layer ceramic capacitors using Struers cutting, embedding, and grinding equipment. The overall flatness of the sample is good, with no obvious cracks or peeling on the edges of the ceramic body, no obvious scratches on the external metal layer, and clear interfaces between each layer.

特邀司特尔专家分享:电子半导体行业样品制备和失效分析技术

After using the Technoorg Linda ion grinder to process the MLCC electrode, combined with the energy spectrum analysis of the Feinner table field emission electron microscope, it was found that the electrode inside the MLCC was oxidized.

About Struers

特邀司特尔专家分享:电子半导体行业样品制备和失效分析技术

Struers was founded in 1875 and focuses on the research and production of metallographic sampling equipment and consumables, including metallographic cutting, inlaying, grinding and polishing, as well as hardness testing equipment. The product is widely used in quality control, failure analysis, and new material research and development. It has always been in a leading position in industries such as automotive, electronics, aerospace, metallurgy, and university research, accumulating complete and efficient solutions.

Looking forward to discussing electronic semiconductor sample preparation and failure analysis techniques with everyone. We believe that this online seminar will bring you valuable knowledge and inspiration. Thank you for your continuous support and attention. Looking forward to your participation! Participate in online seminars, interact in live streaming rooms, and receive high-quality gifts!

特邀司特尔专家分享:电子半导体行业样品制备和失效分析技术