Welcome Customer !

Membership

Help

Beijing Jingke Zhichuang Technology Development Co., Ltd
Custom manufacturer

Main Products:

instrumentb2b>Article

Beijing Jingke Zhichuang Technology Development Co., Ltd

  • E-mail

    2822343332@qq.com

  • Phone

    15810615463

  • Address

    Mapo Xiangyue Sijisan District, Shunyi District, Beijing

Contact Now
Institute of Physics, Chinese Academy of Sciences led the development of FE-5000W ferroelectric tester
Date: 2025-12-01Read: 2

Institute of Physics, Chinese Academy of Sciences led the development of FE-5000W ferroelectric tester

The Chinese Academy of Sciences solemnly declares:

1.Accurate measurement of material products, authentic and reliable data. Please do not trust any other products that replicate our parameters.

2.To protect the interests of buyers, we support payment after the goods are received and inspected.


FE-5000
Type ferroelectric tester

keywords:Hysteresis loop,Ferroelectric tester, voltage, frequency , electrical strain, butterfly curve


Institute of Physics, Chinese Academy of Sciences led the development of FE-5000W ferroelectric testerThe ferroelectric tester

keywords:Hysteresis loop,Ferroelectric tester, voltage, frequency , electrical strain, butterfly curve

<a class=

1、 Product Introduction:

FE-5000Type ferroelectric testerIt is a high range ferroelectric performance material testing device developed by the Institute of Scientific Physics of China. This device can be used for measuring the electrical properties of ferroelectric thin films and ferroelectric materials (both bulk materials). It can measure the hysteresis loop of ferroelectric thin films and measure the values of ferroelectric thin films with asymmetric hysteresis loops.It can perform electrical strain testing and has butterfly curve function,The device can also expand high-temperature resistors and high-temperature dielectrics,capacitance-Voltage curve,TSC/TSDCWaiting for functions.This instrument is one of the important equipment for the production, application, and research of piezoelectric materials and components, and has been widely used in major universities and research institutes.

2、 Main technical indicators:

1Output signal voltage: ±5KV,10 kVScalable electrical response butterfly curve function

2Temperature; room temperature-200℃, temperature control accuracy: ±1℃

3Control the frequency of application0.01to1KHz(Ceramics, single crystals, thin films)PCCustom settings for end software control;

4Control the output current0To ±50mAContinuously adjustable,PCCustom settings for software control on the end.

5Dynamic hysteresis loop testing frequency range0.01Hz-5kHz

7The minimum pulse width holding time is20us;The minimum rise time is10us;

8Fatigue testing frequency500kHz(Amplitude)10 VppLoad capacitance1 nF); The fatigue frequency is highest after using a high-voltage amplifier5kHz;

9、Test speed: Measurement time《5second/Sample • Temperature Point

10Sample specifications: Block material size: Diameter2-100mm, thickness0.1-10mm

11、Main functions:Dynamic hysteresis loopDHMStatic hysteresis loopSHM,I-VCharacteristics, pulsePUND, fatigueFatigueElectric breakdown strengthBDM, leakage currentLM, current-Bias voltage, holding forceRM,

10. Charge resolution not less than10 mC;

Leakage current measurement range:1pA~ 20 mAThe resolution should not be lower than0.1pA;

12Control method: Computer real-time control, real-time display, real-time data calculation, analysis and storage

13Software collection: Automatic collection software, analysis can be compatible with other related mainstream software.

14Testing accuracy: ±0.05%

15Built in voltage:±20V

Expandable module:

Imprint imprintIM

temperature variation testTHM

POMModule implementation of polarization measurement function

CVMModule implementation of small signal capacitance testing, obtainingC-Vcurve

PZMModule implementation of piezoelectric characteristic testing

DPMModule testing for dielectric performance

RTMModule testing resistance/Electrical resistivity performance

CCDMImplement capacitor charging and discharging testing for the module.


Thin film probe station


<a class=

<a class=

<a class=

<a class=


FC-5000And the United StatesTF-2000Comparison chart of test data



<a class=

Tested hysteresis loop, leakage current, breakdown test and other functions