Surge tester

Surge testerIntroduction:

Teseq's NSG 3040 is a multifunctional generator for simulating electromagnetic interference effects in immunity testing. It is easy to operate and has multiple functions, meeting the requirements of conducting EMC testing for enterprises, domestic standards (including IEC/EN standards), and CE mark testing. NSG 3040 adopts the design concept of Special Testing Company, which includes Electronic Fast Transient (EFT) and Power Quality Testing (PQT). The rich extension functions enable the system to provide a wider range of application configurations.

Innovative modular design - NSG 3040 is a multi-purpose system that can be configured and expanded according to basic testing requirements to meet the needs of complex testing laboratories. The mature "master-slave" concept technology enables individual pulse modules to be independently calibrated, and the calibration data and correction coefficients are stored on the slave controller. The new module is easy to install and does not require returning the entire NSG3040 system for calibration.

Due to the use of technical components, NSG 3040 has established new standards in switch switching technology and phase accuracy, surpassing the requirements of current standards. The high-quality and contrast 7 "large color touch screen makes the operation of NSG 3040 very easy. According to the requirements, input can be done through an integrated keyboard or a scroll wheel with sensitivity adjustment keys. In addition, in the development environment, standard testing can be activated with a few "clicks" through the built-in TA (Test Procedure Call) function, quickly and reliably obtaining conclusive results.

The convenient touch buttons make the values of each input parameter very clear and allow users to quickly select and modify all settings. This operation does not require a stylus, and the test parameters can be quickly and easily edited. It is easy to add multi-step testing programs, modify program order and parameter values. In 'expert mode', users can manually modify parameters using the scroll wheel during testing, effectively and quickly simplifying the activation of key thresholds.

The firmware can be quickly downloaded through an SD card reader. It can fully save the user's tests. In the special case of insufficient storage space, the SD memory card purchased from the market can be used to replace the memory card, and the test files stored in it can be easily copied into a larger SD card.

Equipped with Ethernet ports, it can accept external control from personal computers. Windows software simplifies testing programs and allows for writing complex test sequences for various types of tests. During the testing process, operators can observe and generate test reports during testing operations to increase testing efficiency.

Surge testerparameter

Surge Combination Wave Pulse 1.2/50-8/20 µ s (Combination Surge Pulse) - CWM 3450

Pulse complies with IEC/EN 61000-4-5 and GB/T 17626.5 standards

NSG3040 Flexible 4KV Solution for CE Applications

Pulse voltage (open circuit): ± 200V-4.4kV (in 1V steps)

Pulse current (short circuit): ± 100A – 2.2kA

Impedance: 2/12 Ω

Polarity: positive/negative/alternating

Pulse repetition period: 10s-600s (with a step size of 1s)

Test time: 1 to 9999 pulses, uninterrupted

Phase synchronization: asynchronous, synchronous 0-359 ° (with 1 ° as the step size)

Coupling: External/Internal

Fast Transient Pulse Train Test (EFT) 5/50ns - FTM 3425

Pulse complies with IEC/EN 61000-4-4 and GB/T 17626.4 standards

Pulse amplitude:

± 200V -4.8kV (in 1V steps) - open circuit

± 100V – 2.4kV (50 Ω matching system)

Pulse group frequency: 100Hz-1000kHz

Polarity: positive/negative/alternating

Repetition time: 1ms -4200s (70min)

Pulse group time: 1us-1999s, single pulse, uninterrupted

Test time: 1s-1000h

Phase synchronization: asynchronous, synchronous 0-359 ° (with 1 ° as the step size)

Coupling: External/Internal

Voltage sag and voltage drop - PQM 3403

Compliant with IEC/EN 61000-4-11 and GB/T 17626.11 standards

Voltage sag&voltage drop: from EUT input voltage to 0V, 0%

Optional autotransformer Uvar: depending on model (VAR 3005)

Uvar with optional stepper transformer: 0, 40, 70, 80% (INA650x)

Peak impulse current capability: 500A (at 230V)

Switching time: 1-5 µ S (100 Ω load)

Cycle time: 20us to 1999s, cycle 1 to 99'999 times

Test time: 1s-70'000min, 1 to 99'999 cycles, uninterrupted

Repetition time: 40 µ s – 35 minutes, cycle 1 to 99999 times

Phase synchronization: asynchronous, synchronous 0-359 ° (with 1 ° as the step size)

Voltage variation test (only used in conjunction with VAR 3005 series regulators)

Compliant with IEC/EN 61000-4-11 and GB/T 17626.11 standards

0-265V with optional autotransformer (in 1V steps), 0-115% (in 1% steps)

Repetition time: 1ms-35min, cycle 1-99999 times

Test duration: 1ms-5s, cycle 1 to 250 cycles (50Hz)

Repetition time: 10ms-10s; 1-250 cycles (50Hz), 1-300 cycles (60Hz)

Test duration: 1-99999 minutes, 1-99999 events, uninterrupted

Phase synchronization: asynchronous, synchronous 0-359 ° (with 1 ° as the step size)

Pulse magnetic field generated jointly with INA753 and INA701 or 702

Compliant with IEC/EN 61000-4-9 and GB/T 17626.9 standards

Field strength: 1-1200mA/m (in increments of 1A/m)

Polarity: positive/negative/alternating

Repetition time: 5s -10min (in steps of 1s)

Impedance: 2 Ω

Coil factor: 0.0-50.00

Test time: 1-9'999 pulses, uninterrupted

Phase synchronization: asynchronous, synchronous 0-359 ° (with 1 ° as the step size)

EUT power supply: single-phase

EUT VAC: 24 to 260Vrms, 50/60Hz (phase neutral), up to 400Hz

EUT VDC: 0 to 260VDC

EUT current:

1x16Arms， Uninterrupted (temperature monitoring)

1x25Arms， 1 minute

EFT (Pulse Group) couples all lines to the reference ground (GND) in a standard manner