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Shanghai Juna Technology Co., Ltd

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confocal laser scanning microscope

NegotiableUpdate on 05/06
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Overview

Laser confocal scanning microscope achieves real-time confocal microscopy images through a fast optical scanning module and signal processing algorithm. We have solutions for measuring and detecting micro three-dimensional structures, such as semiconductor chips, FPD products, MEMS devices, glass substrates, material surfaces, and more.

Product Details

confocal laser scanning microscopeIt is an accurate and reliable three-dimensional (3D) scanning system that achieves real-time confocal microscopy images through fast optical scanning modules and signal processing algorithms. We have * * solutions for measuring and detecting micro 3D structures, such as semiconductor chips, FPD products, MEMS devices, glass substrates, material surfaces, etc.

Features&Benefits:

High resolution non-destructive optical 3D measurement with automatic tilt compensation

Real time confocal imaging simple data analysis mode

Multiple optical zoom dual Z-scan

Feature detection of large-scale splicing of semi transparent substrates

Real time CCD bright field and confocal imaging without sample preparation

autofocus

Application field:

NS-3500 is a promising solution for measuring low dimensional materials.

Can measure the height, width, angle, area, and volume of micrometer and submicron structures, such as

-Semiconductor: IC graphics, bump height, coil height, defect detection, CMP process

-FPD products: touch screen detection, ITO pattern, LCD pillar spacing height

-MEMS devices: 3D structural profile, surface roughness, MEMS graphics

-Glass surface: thin-film solar cells, solar cell textures, laser patterns

-Material research: Mold surface inspection, roughness, crack analysis

Specification(confocal laser scanning microscopeSpecification:

Model

Microscope NS-3500

remark

Controller NS-3500E

Objective magnification

10x

20x

50x

100x

150x

Observation/measurement range

Horizontal (H): μ m

1400

700

280

140

93

垂直 (V): μm

1050

525

210

105

70

Scope of work: mm

16.5

3.1

0.54

0.3

0.2

Numerical aperture (N.A.)

0.30

0.46

0.80

0.95

0.95

optical zoom

x1 to x6

Total magnification

178x to 26700x

Observation/measurement optical system

Pinhole confocal optical system

height measurement

Measurement scanning

Long scan: 10mm

display resolution

0.001 μm

Repetition rate σ

0.010 μm

Note 1Measure the standard sample (with a step size of 1 μ m) 100 times using a 100 ×/0.95 objective lens.

Width measurement

display resolution

0.001 μm

Repetition rate 3 σ

0.02 μm

Note 2Measure the standard sample (5 μ m spacing) 100 times with a 100 ×/0.95 objective lens

Frame memory

pixel

1024x1024, 1024x768, 1024x384, 1024x192, 1024x96

Monochrome image

12 bit

color image

8-bit for RGB each

height measurement

16 bit

frame rate

Surface scanning

20 Hz to 160 Hz

Line scanning

~8 kHz

automatic function

automatic gain

Laser confocal measurement light source

wavelength

405nm

output

~2mW

Laser grade

Class 3b

Laser receiving element

PMT (Photomultiplier Tube)

Optical observation light source

lamp

10W LED

Optical observation camera

imaging element

1/2 "color image CCD sensor

Record resolution

640x480

auto-adjust

Gain, Shutter Speed, White Balance

Data processing unit

PC

power supply

power supply voltage

100 to 240 VAC, 50/60 Hz

Current consumption

500 VA max.

weight

microscope

Approx. ~200 kg

(Measuring head unit : ~12 kg)

controller

~8 kg