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Beijing Kairuiyong Technology Co., Ltd
Zeiss Material Microscope
NegotiableUpdate on 02/03
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Overview
The principle of Zeiss material microscope is mainly based on optical microscopy and electron microscopy. Optical microscopes magnify samples through refraction and reflection of light, while electron microscopes use electron beams instead of light beams to provide higher resolution and detailed sample imaging.
Product Details
Zeiss Material MicroscopeThe principle is mainly based on optical microscopy and electron microscopy. Optical microscopes magnify samples through refraction and reflection of light, while electron microscopes use electron beams instead of light beams to provide higher resolution and detailed sample imaging. The basic principle of an optical microscope includes focusing light through a lens system to form an enlarged image; Electron microscopes use electron beams to scan samples and collect secondary electron signals to form high-resolution images. These microscopes combine advanced optical design and electronic technology to study the microstructure of materials in greater depth.
Characteristics of Zeiss Material Microscope:
Combining optical microscopy and confocal imaging
The LSM900 confocal platform is developed specifically for demanding material applications in both 2D and 3D.
You can use non-contact confocal imaging to characterize the morphological features of the sample and evaluate surface roughness
Determine the thickness of coatings and films in a non-destructive manner
You can use various imaging methods, including polarization and fluorescence microscopy imaging in optical observation mode or confocal mode
Characterize metallographic samples under reflected light and rock or polymer thin section samples under transmitted light.
Characteristics of Zeiss Material Microscope:
Combining optical microscopy and confocal imaging
The LSM900 confocal platform is developed specifically for demanding material applications in both 2D and 3D.
You can use non-contact confocal imaging to characterize the morphological features of the sample and evaluate surface roughness
Determine the thickness of coatings and films in a non-destructive manner
You can use various imaging methods, including polarization and fluorescence microscopy imaging in optical observation mode or confocal mode
Characterize metallographic samples under reflected light and rock or polymer thin section samples under transmitted light.
