Yuko Spot OSI Prince Measurement Ultra High Phase Difference Measurement Device

Yuko Spot OSI Prince Measurement Ultra High Phase Difference Measurement Device

PAM-UHR100 ultra-high phase difference measurement device

■ Characteristics
measurement method
Parallel Nicol spectroscopy

Sample size of the method
40mm, thickness ≤ 3mm

measurement project
Phase difference orientation angle, birefringence

Oji Keisoku (OSI Prince Measurement) PAM-UHR100 Ultra High Phase Difference Measurement Device Product Introduction

1、 Core positioning and measurement principles

1. Product positioning

• Core purpose:Accurately measure the phase difference, molecular alignment angle, and birefringence Δ n of ultra large phase difference transparent stretched filmsEvaluate the uniformity of stretching orientation, thermal shrinkage characteristics, and optical anisotropy, and solve the problems of insufficient range of conventional phase difference meters (only measuring 0-100nm) and inability to read/skip large phase differences

• Core advantages:Ultra large range of 800~20000nm, repeatability of ± 1nm, fixed polarization optical system, one click automatic calculation of birefringence, compact and stable desktop design

• Applicable scenarios: research and development of optical/packaging stretch films such as PET/PC/PMMA, shrink films, magnetic tape base films, optical disc substrates, and high birefringence polymer materials IQC、 Production line sampling and process parameter optimization

2. Measurement principle (parallel Nicol spectroscopy)

• adoptFixed biased photon+fixed detection photon+white LED+spectral detectionThe parallel Nicol optical architecture avoids wear and drift of rotating components, making it suitable for stable measurement of large phase differences

• Principle: White light passes through a polarized sample analyzer, and through spectral interference signal analysis, it is directly calculatedUltra large phase difference (800~20000nm), alignment angleAfter inputting the sample thickness,Automatically calculate birefringence Δ nNo need for manual conversion

• Light source:White LED solid-state light sourceLong lifespan, stable wavelength, no preheating, suitable for wide spectral phase difference analysis

2、 Key technical parameters (standards)

1. Measure core parameters

• Measurement items:Phase difference (retardation), alignment angle, birefringence Δ n

• Phase difference range:800~20000nm（20μm）(Industry leading ultra large range, covering all high stretch films)

• Phase difference repeatability accuracy:±1nm(3σ)

• Alignment angle measurement range: 0~180 °

• Alignment angle accuracy: ± 0.1 °

• Measurement spot: standard diameter of 5mm (suitable for 40mm square samples)

• Measurement speed: Single point position ≤ 10 seconds (including spectral acquisition and calculation)

• Sample specifications:Square 40mm × 40mm, thickness ≤ 3mm(Transparent stretch film, sheet)

2. Hardware specifications (desktop compact integration)

• Host size:W415 × D325 × H165 mm

• Host weight:About 14kg(Compact desktop, easy to place in laboratory/production line workstations)

• Power supply: AC100V ± 10%, 50/60Hz (adaptable to wide voltage)

• Environmental requirements: Temperature of 10-35 ℃, humidity of 20-80% RH (no condensation)

• System configuration: Measurement host (including optical system+light source+spectrometer), dedicated Windows control software, sample stage, calibration parts, data cable, power cable

3. Software and data functions

• Dedicated Windows software: Real time display of phase difference/alignment angle/Δ n values, spectral curves, measurement data statistics (mean, standard deviation, Cpk), qualification judgment

• Data output: CSV, Excel, PDF reports, supporting batch export, historical data traceability, SPC quality control

• Operation: One click measurement, automatic calibration, automatic calculation of Δ n for thickness input, parameter preset, sample positioning assistance, simple operation, no need for professional optical background

3、 Core product advantages

1. Ultra large phase difference range, solving industry measurement blind spots

• Conventional phase difference meter only measures 0-100nm, PAM-UHR100 coverage800~20000nmAdapt toHigh stretch PET/PC film, shrink film, magnetic tape base filmWaiting for samples with extremely large phase differences, no range limit issues, no hop count/inability to read problems

• Fixed polarization optical system, no rotating parts, strong long-term stability, small drift, and low maintenance cost

2. Ultra high repeatability accuracy ensures measurement consistency

• Repetitive accuracy of phase difference * * ± 1nm * *, maintaining high accuracy even at a super large range of 20000nm, meeting the quality control requirements of R&D and mass production levels

• White light spectral detection, strong anti-interference, not affected by slight thickness/transmittance fluctuations of the sample

3. One click full parameter output to improve efficiency

• Simultaneous measurementPhase difference, alignment angle, birefringence Δ nInput thickness to automatically calculate Δ n without the need for secondary conversion

• Single point position ≤ 10 seconds, higher efficiency than traditional manual/rotary equipment, suitable for batch inspection

4. Compact and stable, suitable for multiple scenarios

• Desktop integration, lightweight (14kg), can be flexibly placed on laboratory R&D tables and production line quality inspection workstations

• LED solid-state light source, lifespan>20000 hours, no preheating, ready to use upon startup, suitable for high-frequency measurement

4、 Typical application areas

1. Polymer film industry: PET/PC/PMMA stretch film, shrink film, optical compensation film, magnetic tape base film, packaging filmTensile orientation evaluation, thermal shrinkage characteristic analysis, birefringence control

2. Research and development of optical materials: research and performance verification of high birefringence polymer materials, optical disc substrates, and liquid crystal matching high phase difference films

3. Quality control of production line: IQC of high stretch film incoming materials, optimization of process parameters, sampling of finished product uniformity, solving the pain point of inability to measure large phase differences

5、 Comparison with conventional models in the same series (PAM-PR300 vs PAM-UHR100)

Welcome industry customers and partners to inquire and negotiate cooperation:

Yuqi Scientific Instruments (Shenzhen) Co., Ltd

Special Manager: ¹⁵⁸¹⁵⁵⁵⁰⁹⁹⁸ (Lin)

Address: Yuqi Science, 7th Floor, E-commerce Group, No. 906 Longhua Street, Longhua New District, Shenzhen, Guangdong Province

#Oji Keisoku OSI Prince Measurement China Agent Tamazaki Scientific Instruments (Shenzhen) Co., Ltd