OSI Prince Measurement Phase Difference Measurement System with Sample Feed

Oji Keisoku (Prince Measurement, OSI) KOBRA-WFD0It is a product specifically designed forLong strip optical thin filmdevelopedHigh precision, automatic style optical degree difference measurement systemThe core is used for thin filmsPhase difference, orientation angle, wavelength dispersion, and incident angle dependenceAnalysis is an equipment for the research and quality inspection of optical films.

1、 Core technical principles

• measurement method：Parallel Nicol Rotation Method

• Compared to the traditional rotary analyzer methodUltra low phase differenceThe sample (such as OLED circular polarizer substrate) has high sensitivity.

• Strong optical path stability, achievableUltra wide rangeOne time measurement without the need to switch gears.

• light source system：6-band solid-state LED light source

• Wavelength:450 / 500 / 550 / 590 / 630 / 750 nm(±2 nm)

• lifespan>20000 hoursMaintenance free, no need to replace mercury/halogen lamps.

2、 Key technical parameters

• measurement range

• Phase difference (retardation)：0 ~ 20,000 nm(Covering the full range from ultra-thin film to thick compensation film)

• Orientation angle (Optic Axis)：0 ~ 90°

• precision metric

• Phase difference resolution:0.001 nm

• Phase difference repeatability:≤ 0.03 nm(150 nm standard sample, 590 nm, 3 σ)

• Angle resolution:0.001°

• Sample Specifications

• Profile measurement: Width50 mmX Lengtharbitrary(Supports continuous automatic feeding)

• Incident angle dependent measurement：30 mm ~ 40×50 mm, thicknesst ≤ 3 mm

• Measurement spot:33 mm ² (5.8 mm square)

• control system

• Specialized software:KOBRA-DSP/FD, KOBRA-RE0

• Support data visualization, report export, and multi-point distribution analysis

3、 Core advantages of the product

1. Wide width automatic sampling

• specially designed forRoll to RollcraftsmanshipLong strip filmDesign to support continuous and automated measurement of longitudinal phase difference profiles.

• Significantly improve detection efficiency, suitable for production line sampling and R&D batch testing.

2. Ultra wide range and ultra-high precision

• Single measurement covering 0 to 20000 nmNo need to replace the detector or adjust the gain.

• rightNm levelUltra thin films (such as COP films for OLEDs) andμ m levelThick films (such as large-sized LCD compensation films) are equipped withnanoscaleMeasurement accuracy.

3. Multi functional analysis capability

• Phase difference distribution (Profile)Uniformity analysis along the width/length direction of the film.

• Angle DependenceSimulate optical performance from different perspectives.

• Wavelength Dispersion CharacteristicsThe trend of phase difference variation under multiple wavelengths.

4、 Typical application areas

• Display optical materialsPhase difference film, polarizing plate, circular polarizer for OLED/LED, liquid crystal compensation film

• polymer materials: Stretch film, polyimide (PI) film, COP/Acrylic Olefin Polymer film

• R&D and Quality InspectionOptical film material development, process stability monitoring, incoming material quality inspection, failure analysis

5、 Summary