X2072 cathodoluminescence EDS spectrometer

Suitable for most samples, including thin sheets, powders, fragments, transparent and non transparent samples, without the need for carbon or gold spraying treatment on the samples.
Microscopic analysis of minerals or samples can be performed through light holes of different sizes (minimum 50-100 μ m), and the average value of unknown mineral components can be obtained by adjusting the beam spot size.
Electron beam excitation of X-ray fluorescence has high intensity, which is about 4-5 orders of magnitude greater than the excitation intensity of the X-ray excitation source. It has high analysis sensitivity and short testing time.
The depth of the electron beam incident on the sample is very shallow (only about 1-2 μ m), which is true surface analysis.
Except for the characteristic X-rays excited, no other noise signals were detected, resulting in more accurate analysis results
The detector can detect elements ranging from 11 (Na) to 92 (U). Especially for the analysis of major elements such as Na, Mg, Al, Si, P, S, Cl, K, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, the sensitivity is high and the spectral line repeatability is good.
Ø Full analysis, built-in diagnostic function, fully automated operation, one click analysis software, easy to operate.