X-ray fluorescence quartz sand composition spectrometer

NegotiableUpdate on 01/17

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Overview

The X-ray fluorescence quartz sand composition spectrometer uses primary X-rays emitted from an X-ray tube to excite the sample. The X-ray fluorescence spectrum generated by the sample directly enters the detector, and X-rays of different energies are processed through multiple circuits to obtain the intensity of characteristic X-ray fluorescence spectra. Based on their energy and intensity, the elements in the measured sample can be qualitatively and quantitatively analyzed.

Product Details

X-荧光石英砂成分光谱分析仪

X-ray fluorescence quartz sand composition spectrometer，from X The primary level emitted by the X-ray tube X Radiation excitation of samples, generated by samples X Direct X-ray fluorescence spectroscopy Entering the detector, different energies X Radiation can be processed through multiple circuits to obtain features X X-ray fluorescence spectroscopyQualitative and quantitative analysis of elements in the tested sample based on their energy and intensity.

X-ray fluorescence quartz sand composition spectrometerIt can be used to detect the content of iron, titanium, silicon, aluminum, calcium, magnesium, potassium, sodium and other elements in quartz sand without damaging the sample. After pressing the sample into a cake, it can be directly measured quickly and efficiently.

After the sample is finely ground by a grinder, it is prepared on a prototype machine. After preparation, the sample is placed in the machine for testing. The entire measurement process takes about 30 minutes and does not require chemical analysis experience or the use of chemical reagents, making it convenient and fast. The instrument comes with analysis software that can perform automatic calculations and detect elements such as element 11 sodium and element 92 uranium.

After sales of the instrument provide on-site installation, debugging, and training services, and laboratory personnel can quickly master the operation process and skills, providing lifelong maintenance services.

Technical parameters of X-ray fluorescence spectrometer
model	XT3
Element Range	11#钠（Na）-92# 铀(u)
Optical path system	The instrument adopts a compact coupled optical path The new compact coupling optical path adopted by the high-sensitivity technology enables the XT3 series to have good precision. Advanced design ensures that the fluctuation range of analysis results is very narrow, thereby reducing light consumption and increasing light revenue. The distance between the X-ray tube and the sample, as well as between the sample and the detector of the XT3 series, has been significantly reduced compared to previous instruments, resulting in less light loss and better performance of the XT3 series.
detector (Imported brand)	Latest New AXAS3.0 H30LE Detector Typical resolution: 126ev Output count rate 1500KCPS Peak to back ratio ≥25000:1 Peak to tail ratio>1800 Refrigeration method: Peltier refrigeration technology Processor: Multi channel analyzer acquisition system
content range	PPM-100%
Primary filter	6-10 position automatic filter; Multiple composite materials can be used for different material testing and can adapt to a wide range of element analysis
X-ray tube (Imported brand)	Rh anode target; Maximum power 50W; maximum voltage 50KV
Measurement Mode	Vacuum mode: reduces operating costs and improves light element analysis performance Air mode
Sample observation	Integrated high-definition camera that can accurately record the measurement position of the sample (Optional)
Sample variety	Powder, solid, tablet, melt, liquid
software algorithm	No standard sample analysis method (optional) Element content can be analyzed without the need for standard substances Standard curve method, theoretical coefficient method, basic parameter method, etc
power supply	220V 50Hz
working environment	Temperature range: 5-30 ℃, humidity ≤ 80%
Dimensions Length x width x height; Weight	800mmx480mmx530mm 70kg

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