X-ray fluorescence coating thickness gauge

EDX-VX-ray fluorescence coating thickness gaugeIt is an X-ray fluorescence coating thickness measurement and composition analyzer developed by Tianrui Instrument, which has more than 30 years of X-ray fluorescence film thickness measurement technology. The instrument adopts a multi-channel capillary X-ray optical system, which can efficiently and accurately measure the coating thickness and composition analysis of micro scale electronic components, chip pins, wafer micro areas and other parts.

EDX-VX-ray fluorescence coating thickness gaugeperformance advantage
1. Based on the detection needs of small samples in the coating industry, we have specifically developed an ultra low beam system suitable for coating detection to reduce energy loss during the process. Equipped with advanced multi-channel capillary focusing tubes, the detection performance of the instrument is greatly improved, with a focus intensity increased by 1000-10000 times, higher detection sensitivity and analysis accuracy, and high counting rate to ensure the accuracy and stability of test results.
2. Panoramic and micro area dual camera design, presenting a full HD wide-angle field of view, making sample observation more comprehensive; Micron level resolution better meets the testing needs of ultrafine products, making testing more extensive and convenient.
3. The advanced multi-channel capillary technology has a signal intensity several orders of magnitude higher than that of metal collimation systems.
4. Multiple specifications of multi-channel capillary tubes are available to meet different testing needs of users.
5. The high-precision XYZ axis mobile testing platform, combined with a dual laser point positioning system, can achieve full automation during the sample testing process with just one click, making testing more worry free.

Product application areas
Measure ultra small components and structures, such as printed circuit boards, connectors, or lead frames;
Analyze ultra-thin coatings, such as Au coatings with a thickness as thin as 2nm and Pd coatings with a thickness of ≤ 30nm;
Measure functional coatings in the electronics and semiconductor industries;
Analyze complex multi coating systems;
Fully automatic measurement, such as: used in the field of quality control;
Compliant with ENIG/ENEPIG requirements, DINISO3497, ASTMB568, IPC4552, and IPC4556 standards.