X-ray crystal spectrometer

X-ray crystal spectrometer

Product Introduction

X-ray crystal spectrometerX-ray imaging crystal spectrometer is commonly used for measuring high-energy rays and is divided into planar crystal spectrometer and curved crystal spectrometer according to the crystal used.

Normally, planar crystal spectrometers are widely used in X-ray spectroscopic analysis due to their simple structure and low processing difficulty*SimpleX-ray spectroscopy measuring instrument. However, the planar spectrometer does not have focusing function, resulting in low light receiving efficiency and weak spectral line intensity. In addition, the size of the light source has a significant impact on spectral resolution, which does not meet the measurement requirements of hyperspectral resolution. The bent crystal spectrometer achieves strong focusing by bending the diffraction surface of the spectral crystal into various curved surfaces.

Spherical curved crystals possess both dispersion and imaging properties in two dimensions. By combining crystal Bragg diffraction and spherical mirror focusing characteristics, spectral and spatially resolved X-ray source images can be obtained simultaneously with a two-dimensional X-ray detector without slits or vacuum. At present, spherical curved crystals have been widely used in inertial confinement and magnetic confinement plasma diagnosis.

Plasma ion temperature and rotation speed are important parameters for characterizing the performance of fusion plasmas, and they are also the data basis for conducting research on numerous plasma physics problems. In tokamak devices, the bent crystal spectrometer measures ion temperature and rotational velocity by measuring the Doppler frequency shift and Doppler broadening of plasma impurity spectral lines.

Based on its independence from neutral beam injection and ability to operate normally under various RF wave heating conditions, it is particularly suitable for measuring plasma temperature under pure RF wave heating and is one of the important physical diagnostics in tokamak devices.

Beijing Zhuoli Instrument Co., Ltd. has launched a complete set of curved crystal spectrometer testing system based on customer needs and 20 years of spectral research and development experience.

The principle of bent crystal spectrometer

RTS-SEMR Raman Electron Microscopy Spectroscopy System

The bent crystal spectrometer is an important tool for X-ray spectroscopy measurement, which works based on Bragg diffraction law. By selecting materials and the shape of bent crystals reasonably, it can accurately control the diffraction effect of X-rays, thereby achieving monochromatic reflection focusing of X-rays. Its configurations are diverse, including John type, Johnson type, logarithmic spiral, ellipsoid, and Von Hamos, and are widely used in scientific research, industrial testing, and other fields. The main components include: bent crystals according to the required testing range, a complete set of optical path construction, and backend detection equipment (mainly vacuum cameras). Among the various components of the bent crystal spectrometer, the detector is one of the key equipment that determines the performance of the bent crystal spectrometer system, especially under the operating conditions of long pulse high-power auxiliary heating plasma. It not only requires a high counting rate, but also a good dynamic range to reflect the changes in plasma parameters before and after heating. Curved crystals cannot focus X-rays, but they can diffract them into a line or point. Curved crystals can be either transmissive or reflective, and can be bent into a surface that conforms to a small portion of a cylindrical, spherical, toroidal, or logarithmic surface.

Schematic diagram of bent crystal spectrometer:

A is the incident point, and B is the imaging surface used for the schematic diagram of the spherical crystal spectrometer on Tokamak

Main parameters of bent crystal spectrometer

Testing X-ray wavelength:

The bent crystal spectrometer is mainly used for measurement in the X-ray wavelength range, usually between 0.1 and 10 nanometers. By selecting crystals with different lattice spacings, the range from soft X-rays to hard X-rays can be covered.

Test energy range

Soft X-rays: suitable for studying light elements and biological samples, typically in the range of several hundred electron volts (eV) to several thousand eV.

Hard X-rays: suitable for studying heavy elements and high-density materials, typically in the range of several thousand electron volts to tens of thousands of electron volts.

Spectral resolution: Depending on the requirements, nanometer level or even higher resolution can be obtained.

technical indicators

■ Wavelength range: 0.1-10nm

Energy range: several hundred eV~tens of keV

Spectral resolution: 100-1000 @ wide spectral range; >1000 @ Spectral Measurement

Accept customized requirements

The relevant configuration references for different application scenarios are as follows:

Related application fields of bent crystal spectrometer

Materials Science: Used to study the microstructure and composition of materials.

Physics: Used to study high-energy physical phenomena and particle properties, such as inertial confinement and magnetic confinement plasma diagnostics.

Chemical analysis: used for quantitative and qualitative analysis of elements in compounds.

Related test data cases

Case 1: Si K α spectral lines obtained from a bent crystal spectrometer built with Andor vacuum camera Case 2: Data measured from a bent crystal spectrometer built with Detrics PILATUS camera

Matching detector option 1 (Andor):

Matching detector option 2 (Decrris)