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Guochuang Scientific Instruments (Suzhou) Co., Ltd
X-ray Fine Structure Analysis Spectrometer
NegotiableUpdate on 02/09
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Overview
X-ray Fine Structure Analysis Spectrometer (XAFS/XES) is a non-destructive technique used to study the local structure and electronic state of materials. XAFS/XES is mainly used for the analysis of valence states, coordination structures, and electronic states of metal ions in catalysts, alloys, ceramics, environmental pollutants, various crystalline and amorphous materials, and biological samples, as well as the study of the dynamic evolution process of local structures of materials under changes in thermal, optical, electric, and magnetic fields.
Product Details
X-ray Fine Structure Analysis SpectrometerXAFS/XES is a non-destructive technique used to study the local structure and electronic state of materials. This technology utilizes the interaction between X-rays and matter to obtain the near edge absorption spectrum (XANES), extended far edge absorption spectrum (EXAFS), and specific band emission spectrum of a specified element, which are used to analyze the chemical and valence states of the element, the coordination structure of the local environment around the atom, and to distinguish the coordination atom category of the measured element. It is an important means of characterizing the micro coordination structure of crystalline and amorphous materials. XAFS/XES is mainly used for the analysis of valence states, coordination structures, and electronic states of metal ions in catalysts, alloys, ceramics, environmental pollutants, various crystalline and amorphous materials, and biological samples, as well as the study of the dynamic evolution process of local structures of materials under changes in thermal, optical, electric, and magnetic fields.
1. X-ray Fine Structure Analysis Spectrometercore principle
X-ray Absorption Fine Structure (XAFS):
When X-rays pass through a material, atoms absorb specific energy (corresponding to electron transitions), forming an absorption spectrum. The fine structures near the absorption edge (EXAFS and XANES) reflect information such as atomic spacing, coordination number, and local structure.
EXAFS (Extended X-ray Absorption Fine Structure): High energy oscillation signal reflecting the arrangement of neighboring atoms.
XANES (X-ray Absorption Near Edge Structure): The region near the absorption edge reflects the electronic state and symmetry.
2. Instrument composition
Light source: Synchrotron radiation source (high brightness, continuously adjustable energy) or laboratory X-ray tube (such as Cu target, Mo target).
Monochromator: Select X-rays of specific energy (such as silicon crystal monochromator).
Sample Room: Vacuum or controlled atmosphere environment, equipped with a sample stage.
Detector:
XAFS: Ionization chamber or silicon drift detector (SDD) measures fluorescence or transmission signals.
XPS: Hemisphere Analyzer (HEA) measures the kinetic energy of photoelectrons.
Data system: Collect and process spectra (such as Fourier transform for EXAFS analysis).
3. Key parameters
Energy resolution: the ability to distinguish spectral details (such as eV level).
Signal to noise ratio: affects the detection of weak signals (synchrotron radiation can significantly improve the signal-to-noise ratio).
Detection depth:
XAFS: Volume sensitive (transmission mode) or surface sensitive (fluorescence mode).
XPS: Surface sensitive (detection depth of about 1-10 nm).
4. Application Fields
Materials Science: Catalyst Active Sites, Localized Structure of Battery Materials, Nanoparticle Size.
Chemistry: coordination environment, oxidation state (such as Fe ² ⁺/Fe ³ ⁺ differentiation).
Environment/Biology: Heavy metal adsorption mechanism, protein metal center structure.
Semiconductor: Analysis of Thin Film Composition and Interface Chemical States (XPS).
5. Data processing
XAFS:
Background deduction (such as Victoren's formula).
Edge normalization.
The EXAFS Fourier transform obtains the radial distribution function.
Fitting models (such as FEFF theoretical calculations).
XPS：
Combined energy calibration (usually with C 1s=284.8 eV as a reference).
Peak fitting (peak analysis of chemical states).
6. Advantages and disadvantages
Advantages:
Element selectivity (specific absorption edge or photoelectron peak).
No need for long-range ordering (applicable to amorphous and liquid materials).
Limitations:
XAFS requires a high brightness light source (synchrotron radiation is optimal).
XPS is limited to surface analysis and may be affected by charge effects.
7. Expansion technology
μ - XAFS: Micro area analysis (spatial resolution in μ m level).
In situ XAFS/XPS: Real time monitoring of reaction processes (such as electrochemistry and high temperature).
8. Common abbreviations
XAFS：X-ray Absorption Fine Structure
XANES：X-ray Absorption Near Edge Structure
EXAFS：Extended X-ray Absorption Fine Structure
XPS：X-ray Photoelectron Spectroscopy
masterX-ray Fine Structure Analysis SpectrometerAfter these basic knowledge points, one can further learn specific experimental designs, data analysis methods, or combine other characterization techniques (such as XRD, XAFS) for comprehensive material analysis.
