Wide energy spectrum X-ray absorption spectrometer

Guochuang Technology InstrumentWide energy spectrum X-ray absorption spectrometerSuperXAFS T2000

Core parameters

1.Energy Range:2-20keV
2.Luminous flux at the sample location:≥4×10⁶photons/s @7-9 keV

3.Energy resolution:0.4-0.9eV@2-5 keV
4.Energy repeatability：≤30 meV@24h
5.Adjustment mechanism accuracy:The minimum step size for energy scanning is 0.1eV

Highly adaptable

While meeting all routine sample tests, it can also meet special sample tests, such as phosphorus, potassium, actinide, toxic, radioactive samples, etc.

Easy to operate

1. Built in different element parameters for quick switching of measurements.
2. Provide a standard sample database to simplify the analysis process.
3. Support automatic collection of multiple samples to reduce the number of injections.
4. Remote real-time monitoring, equipped with multiple safety interlock designs.

Guochuang Technology InstrumentWide energy spectrum X-ray absorption spectrometerSuperXAFS T2000

X-ray Absorption Fine Structure Spectrometer (XAFS/XES) is a non-destructive technique used to study the local structure and electronic state of materials. This technology utilizes the interaction between X-rays and matter to obtain the near edge absorption spectrum (XANES), extended far edge absorption spectrum (EXAFS), and specific band emission spectrum of a specified element, which are used to analyze the chemical and valence states of the element, the coordination structure of the local environment around the atom, and to distinguish the coordination atom category of the measured element. It is an important means of characterizing the micro coordination structure of crystalline and amorphous materials. XAFS/XES is mainly used for the analysis of valence states, coordination structures, and electronic states of metal ions in catalysts, alloys, ceramics, environmental pollutants, various crystalline and amorphous materials, and biological samples, as well as the study of the dynamic evolution process of local structures of materials under changes in thermal, optical, electric, and magnetic fields.