Wafer inspection microscope

Wafer inspection microscopeThe large platform wafer inspection microscope is a high-tech product developed by combining advanced optical microscopy technology, photoelectric conversion technology, and computer imaging technology. It is possible to manually observe metallographic images and conveniently capture them on a computer at any time for analysis, grading, and printing of high-resolution metallographic photographs.

Wafer inspection microscopeThe system combines traditional optical microscopes with computers (digital cameras) through photoelectric conversion. It can not only perform microscopic observations on the eyepiece, but also observe real-time dynamic images on the computer (digital camera) display screen, and edit, save, and print the required images.

The (large platform wafer inspection microscope) is equipped with a large moving range stage, a falling beam illumination device, a flat field achromatic objective lens, a large field eyepiece, clear images, good contrast, and a polarizing device. It is an ideal instrument for research in metallurgy, mineralogy, precision engineering, electronics, and other fields. Suitable for use in schools, scientific research, factories, and other departments.