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Visoria M material microscope

NegotiableUpdate on 07/07
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Overview

Visoria M material microscope, with built-in focusing limit device, can protect the sample and objective lens from accidental damage.

Product Details

Experience higher efficiency and comfort in daily microscope operations. The Visoria M material microscope is suitable for the metal, electronics, and polymer industries as well as materials science laboratories.

The use of encoding features, optimized light intensity settings, and other microscope functions can improve the efficiency of your workflow. In addition, the ergonomic design of the microscope allows you to work more comfortably and minimize strain.

Efficiently and comfortably complete daily operations

Visoria M material microscopeThe benefits:

Visoria M 材料显微镜

Improve efficiency through encoding functionality

Improve the efficiency of daily microscope tasks. Save valuable time by simplifying document recording and coding microscope functions, allowing you to focus on the sample.

Visoria M 材料显微镜

Adopting ergonomic design for more comfortable use

Use symmetrically arranged controls and ergonomic accessories to work in a comfortable posture. These features help reduce neck and back strain, even when working in front of a microscope for extended periods of time.

Visoria M 材料显微镜

Driven by Enersight microscope software

Using Visoria M material microscope and Enersight software platform can simplify and make your workflow more efficient.


knowVisoria M material microscope

Used for daily material inspection

Using the Visoria M material microscope, you can examine the microstructure of materials such as metals, alloys, electronic and mechanical components, composite materials, glass, ceramics, etc. When used in conjunction with the Enersight software platform, you can also perform cross-sectional or layer thickness analysis.

Visoria M material microscope

Save time through optimized light intensity settings

By using Visoria M, you can have more time to observe and inspect the samples. If you change the magnification or observation mode of the microscope, there is no need to manually adjust the brightness, as it has a light intensity management function. Thanks to the encoding function of the microscope, the lighting settings will be automatically applied.

Observe the sample under ideal lighting conditions without adjusting the intensity settings of the microscope.

Simplify the process of document recording

You only need to press a button to quickly capture sample details, while keeping your eyes fixed on the image. The image acquisition button on the Visoria M microscope stand is within reach.

When you store images for document recording, the selected system settings are automatically saved along with the source data of the images.

The scale bar will automatically adjust and be added to the image, thereby improving efficiency and saving your valuable time.

Visoria M 材料显微镜


Simply press a button on the microscope stand to capture images, saving time and effort.

Easy operation of microscope

Visoria M is intuitive to operate and can quickly and reliably complete daily tasks.

By color coding, it is easy to find the appropriate aperture for each objective lens.

Built in focusing limit device can protect the sample and objective lens from accidental damage.

To achieve more fine focusing at higher magnification, please use the three gear focusing system - coarse, middle note and fine.

Scale of aperture stop, incident optical axis

The scale of the aperture stop on the transmitted light condenser and the incident optical axis has color markings that match the color code of the objective lens.

Using a digital microscope to achieve eyepiece free operation

The Visoria M digital material microscope without an eyepiece has many practical advantages:

View images directly on the tablet and work in a comfortable and relaxed position.

Quickly present and document work steps, and easily discuss image results with colleagues.

No need for a computer, saving workspace.

Visoria M 材料显微镜


The user is operating the Visoria M digital material microscope.

Maintain comfort during work

Visoria M can adapt to your needs, allowing you to maintain the correct posture during prolonged use of the microscope and reducing the risk of neck and back strain.

The focus and stage control knobs adopt a symmetrical layout and adjustable height, so you can keep your shoulders level, and the hand and arm posture conforms to ergonomics, making it easy and comfortable to work. You can operate Visoria M with one hand.

Easy switching between right-hand and left-hand operation, especially useful when sharing a microscope with other users.

Visoria M 材料显微镜


Users can maintain a comfortable posture while using Visoria M.

Adjusting the microscope with ergonomic accessories

Thanks to the excellent adaptability of Visoria M, you are able to maintain a straight posture. You can choose from a range of ergonomic accessories to meet your needs.

Ergonomic eyepiece tube: You can choose a 15 ° ergonomic eyepiece tube or an adjustable VarioTube (tilt angle 0-35 °) to maintain a relaxed head posture while obtaining flexible viewing angles.

Ergonomic eyepiece tube angle module: Inserting ErgoModule below the eyepiece tube can adjust the height of the eyepiece, allowing for comfortable sitting posture during work.

Ergonomic adjustment plate: The optional ErgoLift adjustment plate can easily adjust the height of the microscope.

Visoria M 材料显微镜


Flexible adjustment of eyepiece observation angle and height, as well as the overall height of the microscope.

Reduce repetitive actions to minimize strain

Do you need to work in front of a microscope for a long time?

Using Visoria M can reduce the risk of physical discomfort and repetitive strain injuries. Minimize repetitive actions by adjusting the height and torque of the stage and focusing controls.

Visoria M 材料显微镜


The XY stage position and focusing knob are easy to operate and can be adjusted with one hand.

Presenting sample details in an appropriate way of observation

In the fields of industrial and material inspection, as well as research and development, Visoria M can be used to observe the details of sample structure and defects (such as scratches or contamination).

It uses multiple observation methods, including

bright field

Dark Field

polarized light

Differential Interference (DIC)

Tilt lighting

fluorescence

Tilted lighting is particularly helpful for better observation of surface morphology.

Visoria M 材料显微镜


The same inclusion images were collected using Visoria M through A) bright field, B) dark field, C) differential interference contrast, and D) oblique illumination.

Quickly overview the sample using a 0.7x macro objective lens

When you need to observe macroscopic structures, you can use the optional 0.7x macroscopic objective lens to quickly switch from sample overview to observing small details. It allows you to see the sample area with a diameter of about 36 millimeters at a glance, and enables quick positioning and overview. Compared to using traditional objective lenses for sample overview, using macroscopic objectives can save sample screening time.

You can also use various objective lenses to observe small details of the sample at higher magnification.

Visoria M 材料显微镜


Use the optional 0.7x macro objective lens to quickly overview the sample and save sample screening time.

Driven by Enersight software platform

Using Visoria M material microscope and Enersight software platform can simplify and make your workflow more efficient. It provides an intuitive interface to help you seamlessly compare, measure, and share data.

Important advantages:

Use the layer thickness measurement function to determine the thickness of the coating or layer.

Use the XY stitching function of the manual stage to observe samples with a larger field of view and higher resolution.

Use the Depth of Field Extension (EDOF) function to capture clear sample images.

Use the quick brightness adjustment function to capture images with ideal lighting and camera settings.

Optimize images by automatically correcting shadows caused by uneven lighting.

Merge multiple images obtained from different observation methods (such as bright field and dark field) to better understand the sample.

Semi automatic measurement can provide information on the minimum, maximum, and average thickness of coatings or layers.