Universal X-ray absorption spectrometer

NegotiableUpdate on 02/09

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

The SuperXAFS H3000, a universal X-ray absorption spectrometer developed by Guochuang Technology, achieves element specificity and local structure analysis without damaging the sample by detecting the atomic neighbor environment and valence state. It is particularly suitable for studying micro mechanisms that are difficult to solve with traditional characterization methods such as XRD and SEM. Its application spans across multiple fields from basic science to industrial practice, becoming a key tool for connecting atomic scale structures with macroscopic performance.

Product Details

Guochuang Technology InstrumentUniversal X-ray absorption spectrometerSuperXAFS H3000

Core parameters

1. Working mode: Supports near edge quick scan function; Support transmission/fluorescence mode absorption spectra

2. Energy range: 4.5-20keV, upgradable to 25keV

3. Luminous flux at the sample site: ≥ 4 × 10⁶photons/s @7-9 keV

4. Energy resolution: 0.5-1.5eV@7-9keV

5. Energy repeatability: ≤ 30meV@24h

6. Adjustment mechanism accuracy: The minimum step size for energy scanning is 0.1eV

Guochuang Technology InstrumentUniversal X-ray absorption spectrometerSuperXAFS H3000

X-ray Absorption Fine Structure Spectrometer (XAFS/XES) is a non-destructive technique used to study the local structure and electronic state of materials. This technology utilizes the interaction between X-rays and matter to obtain the near edge absorption spectrum (XANES), extended far edge absorption spectrum (EXAFS), and specific band emission spectrum of a specified element, which are used to analyze the chemical and valence states of the element, the coordination structure of the local environment around the atom, and to distinguish the coordination atom category of the measured element. It is an important means of characterizing the micro coordination structure of crystalline and amorphous materials. XAFS/XES is mainly used for the analysis of valence states, coordination structures, and electronic states of metal ions in catalysts, alloys, ceramics, environmental pollutants, various crystalline and amorphous materials, and biological samples, as well as the study of the dynamic evolution process of local structures of materials under changes in thermal, optical, electric, and magnetic fields.

Application fields of X-ray absorption spectrometer

Catalyst research

Analyze the metal valence states of catalyst active centers (such as Pt ²)⁺/Pt⁰）The coordination environment and atomic spacing reveal the catalytic reaction mechanism (such as the oxygen reduction activity of fuel cell catalysts).

Track the structural evolution of catalysts in reactions, such as the valence state changes of Cu based catalysts in CO oxidation reactions.

Characterization of nanomaterials

Determination of surface atomic coordination and defect concentration (such as TiO) of nanoparticles (such as quantum dots, nano oxides)₂Oxygen vacancies in nanotubes.

Study the interface electronic structure of nanocomposites, such as charge transfer between graphene and metal nanoparticles.

Functional Material Analysis

Detecting battery electrode materials (such as LiCoO)₂）Optimizing battery performance through changes in elemental valence states during lithium insertion/extraction processes.

Analyze magnetic materials (such as Fe)₃O₄）Explain the mechanism of magnetic ordering in the local magnetic environment.