Thermal conductivity analyzer is another powerful tool for measuring material thermal diffusion and thermal conductivity. According to ASTM E1461 standard, Nanoflash amp; #174; Using a xenon lamp as a heating source to heat the surface of the sample and an infrared detector to read the temperature rise of the sample reduces potential surface thermal resistance, allowing for precise measurement of thin samples such as coatings, thin film materials, or multi-layer samples on substrates.
NETZSCH LFA 447 Nanoflash ® Flash thermal conductivity meter,Thermal conductivity analyzerAnother powerful tool for measuring the thermal diffusion and thermal conductivity of materials. According to ASTM E1461 standard, Nanoflash ® Using a xenon lamp as a heating source to heat the surface of the sample and an infrared detector to read the temperature rise of the sample reduces potential surface thermal resistance, allowing for precise measurement of thin samples such as coatings, thin film materials, or multi-layer samples on substrates.
Nanoflash ® The operation is highly automated: the testing temperature and flash on/off are controlled by software, and data analysis is performed. The automatic sampling system allows the instrument to measure multiple samples in one testing process. After the furnace reaches the set temperature, the collection of each data point is usually less than five minutes. The instrument can set the flash energy level, pulse width, and temperature separately for each sample. The range of thermal diffusion coefficients measured is very wide, covering various materials from polymers to diamonds.
Thermal conductivity analyzerMeasurement principle: As a heating source, a xenon lamp emits a pulse that hits the lower surface of the sample. The corresponding temperature rise on the upper surface of the sample is measured by an infrared detector, and the thermal diffusion coefficient of the sample is calculated by software.
The instrument can simultaneously measure the thermal diffusivity coefficient (α) and specific heat (Cp). The measurement of specific heat is obtained by comparing the actual temperature rise of the sample with the temperature rise of a reference sample with known specific heat. If the density (ρ) of the sample is known, the thermal conductivity (λ) of the sample can be calculated according to the following formula:
λ(T) = α(T) * Cp(T) * ρ(T)
By using the built-in automatic sampler with 2 or 4 sample grades, multiple samples can be measured simultaneously. The sample tray is easy to operate, the sample preparation is fast, and the sample measurement cycle is short.